Hitachi Global Storage Technologies Netherlands B.v.

Garth Wade Helf

Paul Marion Green

Michael Cosci

Robert Waltman

Eric Christian O'Brien

Alan P Giorgi

Anthony L Smith

Qin Pan

A method is presented for controlling process delay times between a) thin film deposition and lubricant application, and b) lubricant application and abrasive polishing. Applicants have discovered that for certain lubricants, a minimum delay time after the overcoat has been deposited before the lubricant is applied increases the number of disks passing the glide test after abrasive polishing. In addition, applicants have discovered that for certain lubricants, the abrasive polishing should take place within a maximum time window following the application of the lubricant. A computerized work-in-progress tracking system is preferably used to implement the method of the invention.

Control of process timing during manufacturing of magnetic thin film disks

A method for identifying a problem with a magnetic disk, comprising testing both sides of a disk for read errors using a pair of heads, flipping the disk 180 degrees, again testing both sides of the disk for read errors using the same heads, determining whether one side of the disk has more errors than the other side both before and after the flip, and determining that the disk is the cause of the read errors if the same side of the disk still has more errors than the other side after the flip.

Method for hard disk drive flip disk diagnostics

A method of yield improvement for manufactured products includes providing an identification plan for parts and processing equipment, whereby each part and each piece of equipment is given unique and traceable identification data. A database is provided into which the parts identification data and the processing equipment identification data are stored, and related. The parts are processed in at least one processing stage by the processing equipment to yield processed parts, and the processed parts are tested for defects. Problems are then identified through the testing of the processed parts. The related parts identification data and the processing equipment identification data are retrieved from the database, and the data is analyzed to trace the parts to the appropriate processing equipment. Corrections and repairs are made to the processing equipment to correct the problems. Improvement to yield of the manufactured products is then confirmed.

Method for yield improvement of manufactured products

A system for improving manufacturing yields, which includes at least one manufacturing facility into which unprocessed parts enter. An identification plan is provided for the unprocessed parts, by which each unprocessed part is given unique and traceable unprocessed part identification data. Processing equipment is included by which the unprocessed parts are turned into processed parts. There are identification plans for the processing equipment and for the processed parts by which each piece of equipment and each processed part is given unique and traceable processing equipment identification data. At least one computer terminal is connected to a database into which the unprocessed parts identification data, the processed parts identification data and the processing equipment identification data is stored, and related. This data is retrievable to allow processed parts with defects to be traced to the processing equipment by which it was processed for repair or modification of the processing equipment.

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San Jose, CA, United States of America

Garth Wade Helf