The Boeing Company

Garnel King

Dennis Lynn Coad

Bruno Zamorano Senderos

Rogie I Rodriguez

Stefanie Anita Meier

Jennifer L Chevallier

The present disclosure provides an apparatus and method of use thereof for compressive creep testing of materials in the presence of fluids. The apparatus includes a cantilever arm connected on a first end to a cantilever pivot and including a weight holder on a second end; a first platen connected to the cantilever arm via a swivel located between the first end and the second end; a reservoir; and a second platen disposed within the reservoir and positioned to secure a sample between the first platen and the second platen when a force is applied via the weight holder and the first platen to a sample. Electrical properties of the material can be monitored and measured during the compression creep testing.

Compressive creep flow determination in fluids

Described herein are dielectric fluid testers for determining dielectric breakdown of fluid samples, systems comprising such testers, and methods using thereof. A dielectric fluid tester comprises a container and two electrodes. The test heads of these electrodes protrude inside the container and face each other, forming a gap. In some examples, one or both electrodes are movable for adjusting the gap and/or the volume inside the container available for a fluid sample. For example, the container includes two internal seals, one of which has a fixed position and is slidably coupled to a respective electrode. The other seal is slidably coupled to the container and moves together with the corresponding electrode. The container comprises an access port, providing a fluid communication between the fluid sample and an external pressure-controlling source. In some examples, the access port is used to deliver and remove the fluid sample from the container.

Method and systems for determining dielectric breakdown voltages of fluid samples using dielectric fluid testers

A test fixture configured to attach to and apply a tensile force to a test specimen. The test fixture may include a first clevis section and a second clevis section that are each configured to be attached to the test specimen. Each of the first and second clevis sections may include a fixed block and a movable block. Connectors connect the clevis sections together and hold the test specimen. The first and second clevis sections may be moved apart to apply a force to the attached test specimen to test one or more properties of the test specimen.

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Madison, AL, United States of America

Garnel King