Institut National De La Recherche Scientifique

Gargi Sharma

Tsuneyuki Ozaki

Kanwarpal Singh

Roberto Morandotti

A method for characterizing terahertz radiation using spectral domain interferometry, comprising overlapping a pump beam and a terahertz beam in a detecting crystal; obtaining two probe pulses by propagating the probe beam into a polarization maintaining single-mode optical fiber after the detecting crystal; and measuring a change in the optical path difference between the two probe pulses. The system comprises a detection crystal, where a terahertz pulse and a probe beam are made to overlap; a polarization-maintaining optical fiber propagating the probe beam after the detection crystal and outputting two probe pulses; and a spectrometer where the two probe pulses interfere.

Method and apparatus for characterization of terahertz radiation

A method and system based on spectral domain interferometry for detecting intense THz electric field, allowing the use of thick crystal for spectroscopic purposes, in order to makes long temporal scans for increased spectral resolutions, and overcoming the limitation of over-rotation for presently available high power THz sources. Using this method and system the phase difference of approximately 8898&#x3c0; can be measured, which is 18000 times higher than the phase difference measured by electro-optic sampling (&#x3c0;/2).

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Brampton, Canada

Gargi Sharma