Agilent Technologies, Inc.

Hewlett-packard Company

Gangqiang Li

Stuart Carl Hansen

Alexander Mordehai

Hongfeng Yin

Carl A Myerholtz

Thomas P Doherty

Scott W Corzine

Kevin P Killeen

Reid Alyn Brennen

Charles William Russ, Iv

August Jon Hidalgo

Christian A Le Cocq

Tom A Van De Goor

George E Yefchak

Maozi Liu

Gavin Reid

A mass spectrometer system an ion source configured to produce ions and a non-metallic capillary configured to receive at least a portion of the ions from the ion source. The capillary includes an elongated body and multiple bores traversing the elongated body in a longitudinal direction. The bores transport the received ions through the capillary toward a mass analyzer of the mass spectrometer system for detection.

Multi-bore capillary for mass spectrometer

A gas chromatograph-mass spectrometer (GC-MS) system includes a multi-capillary GC column coupled to a mass analyzer through an ionization interface. The ionization interface includes an ionization device and an ion guide configured for receiving a high-capacity gas-sample flow from the GC column and transmitting a compressed ion beam to the mass analyzer. The ion beam may be converging.

Multi-capillary column and high-capacity ionization interface for GC-MS

Devices and systems for reflecting ions are provided. In general, the devices and systems include a plurality of curved lens plates adapted for connection to at least one voltage source and having a passage therein to allow the ions to pass therethrough. The plurality of curved lens plates generates electric fields having elliptic equipotential surfaces that reflect and focus the ions as they pass through the passage. Reflectron time-of-flight (RE-TOF) spectrometers are also provided that include an ion source, ion detector, and such a reflectron as described above. Mass spectrometer systems are provided that comprise an ion source that generates ions and a reflectron TOF spectrometer such as described above.

Device, system, and method for reflecting ions

An ion source a first ionizer comprising: an electrospray needle comprising a tip; and a conduit disposed annularly about the needle and configured to pass an inert gas in proximity of the tip to nebulize a fluid emerging from the tip, the nebulized fluid comprising analytes and a mobile phase. The ion source comprises a capillary in tandem with the first ionizer and configured to receive the droplets; a heater configured to heat the capillary to a temperature at which mobile phase vaporizes; and a second ionizer in tandem with the capillary and configured to receive the vaporized mobile phase and the analytes. A method is also described.

Tandem ionizer ion source for mass spectrometer and method of use

An electric field source for a mass spectrometer and a mass spectrometer are described.

Mass spectrometer and electric field source for mass spectrometer

In accordance with the invention, auxiliary structures are used in conjunction with a microfluidic chip to form a microfluidic electrospray structure that allows gas assisted nebulization for use in a mass spectrometry system.

Micro fluidic gas assisted ionization structure and method

The invention provides an ion extraction pulser. The ion extraction pulser may be used independently or in conjunction with a mass spectrometry system. The mass spectrometry system includes an ion source for producing ions, an ion optics system downstream from the ion source for selecting and directing ions, and a detector down stream from the ion optics system for detecting the ions selected and directed by the ion optics system. The ion optics system includes one or more ion extraction pulsers. The ion extraction pulser includes a mesh plate for applying a pulse for extracting ions from an ion beam; a first filter plate adjacent to the mesh plate for filtering ions extracted by the mesh plate; a guard plate adjacent to the first filter plate for further directing ions filtered by the first filter plate; and a second filter plate adjacent to the first guard plate for further filtering ions directed from the guard plate The invention also provides methods for extracting, selecting and processing ions using ion extraction pulsers.

Ion extraction pulser and method for mass spectrometry

A method and apparatus for processing ions in mass spectrometry is provided. The apparatus includes an ion processing cell having segmented multipole rods and a means for admitting reactive reagent ions to the cell. Provision for timed sequence control of RF and DC voltages to the segmented multipole rods is included. Processing includes trapping analyte ions and subjecting them to selected reactions with reactive reagent ions and/or physical manipulation of the ions by changing the characteristics of the electric field and/or creating discrete regions in the field.

Segmented rod multipole as ion processing cell

A mass spectrometer sample input interface comprises a desolvation apparatus defining a desolvation pathway along which a desolvation gas flows, in a direction from upstream to downstream, the desolvation pathway having a desolvation pathway portion; and an ion pathway apparatus for defining an ion pathway for analyte solution droplets to follow, the ion pathway leading into the mass spectrometer, the ion pathway including an ion pathway portion that follows the desolvation pathway portion.

Mass spectrometer interface for atmospheric ionization ion sources

The invention provides a mass spectrometry system, including a microfluidic chip for electrospray ionization having an analyte channel and a gas assist channel that define a spray tip and a detector downstream from the microfluidic chip for detecting ions. The invention also provides a micro fluidic chip for electrospray ionization including a substrate having an analyte channel, a gas channel and an analyte channel wherein the gas channel and analyte channel exit at the first end to define the electrospray tip. Methods of using the system and apparatus are also disclosed.

Micro fluidic gas assisted ionization device and method

The invention provides an apparatus for combining ions and charged particles. In general, the apparatus contains: a) a multipole device having an ion exit end; b) a mass analyzer; and c) a source of charged particles. The apparatus is configured so that charged particles produced by the source of charged particles pass through the mass analyzer and into the multipole device via the ion exit end of the multipole device.

Methods and compositions for combining ions and charged particles

The invention described herein provides a mass spectrometry system, having an ion source including an ionization device for producing ions, a collection conduit adjacent to the ionization device for collecting ions produced by the ionization device, a first gas source for supplying gas to desolvate ions produced by the ionization device, a second gas source for supplying gas at a defined flow to the ionization region, and a detector downstream from the ion source for detecting ions produced by the ion source. The invention also provides an ion source including an ionization device for producing ions, a collection conduit adjacent to the ionization device for collecting ions produced by the ionization device, a first gas source for supplying gas to desolvate ions produced by the ionization device, and a second gas source for supplying gas at a defined flow to the ionization region. A method for producing analyte ions is also disclosed. The method includes producing analyte ions from an ionization device, directing a first heated gas toward the analyte ions to desolvate the analyte ions, and directing a second gas toward the analyte ions at a defined and continual flow rate.

Apparatus and method for gas flow management

A multi-channel high field asymmetric waveform ion mobility spectrometer (FAIMS) is provided. The apparatus provides for substantially simultaneous FAIMS analysis of plurality of ions from a single sample. The apparatus has a analyzer region comprising a hollow electrode, a plurality of plate electrodes positioned parallel to and distanced from the hollow electrode, a contact for applying an high voltage asymmetric waveform to the hollow electrode and a plurality of contacts for applying a compensation voltage to the plurality of plate electrodes. A method for substantially simultaneous FAIMS analysis of plurality of ions from a single sample is also provided.

Multi-channel high-field asymmetric waveform ion mobility spectrometry

This invention provides an apparatus and method for efficient detection of ions in a time-of-flight mass spectrometer. The apparatus of the invention provides for orthogonal deflection of ions in the flight tube of a time of flight mass spectrometer to a detector or detectors positioned along or in the wall of the flight tube of the mass spectrometer. A method of detecting ions utilizing the apparatus is also provided.

Time-of-flight spectrometer with orthogonal pulsed ion detection

The invention provides a device for introducing ions into the primary ion path of a mass spectrometry system. In general, the device contains an electrical lens having a primary ion passageway and a secondary ion passageway that merges with the primary ion passageway. In certain embodiments, the electrical lens contains a first part and a second part that, together, form the primary ion passageway. The first part of the lens may contain the secondary ion passageway.

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Palo Alto, CA, United States of America

Gangqiang Li