Diodes Inc.

Gan Yao

Yu Liu

Jie Ren

A method includes configuring a preset reference pulse number, and controlling a test contact piece for testing chip leads to move toward a target chip lead, using a control signal corresponding to the preset reference pulse number. First data is continuously obtained and used to determine whether the test contact piece is in contact with the target chip lead. When the test contact piece is in contact with the target chip lead, the test contact piece is controlled to stop moving. Second data is obtained characterizing movement of the test contact piece from a time when the test contact piece initially contacts the target chip lead to a time when the test contact piece stops moving. The preset reference pulse number is adjusted based on the second data. A system and device, and a computer-readable storage medium are also provided for implementing the method.

Growing community of inventors

Chengdu, China

Gan Yao