Stmicroelectronics S.r.l.

Gaetano Palumbo

Domenico Pappalardo

Carmelo Ucciardello

Antonino Conte

Francesco Pulvirenti

Maurizio Giovanni Gaibotti

Gregorio Bontempo

Salvatore Nicosia

Luca Giuseppe De Ambroggi

Francesco Sorrentino

Giovanni Pagano

Giuseppe Maganuco

Paolo Scalisi

Stefano Lo Giudice

Rosa Di Mauro

Protecting the devices of a charge pump includes the connection of a high-voltage transistor between the output node of the charge pump and the load being supplied, and in controlling this transistor with a fraction of the output voltage of the charge pump. This control is accomplished by connecting the control node of the high-voltage transistor to a node of connection between two stages of the multi-stage charge pump onto which a fraction of the controlled output voltage of the multi-stage charge pump is produced. The high-voltage output transistor protects the low voltage devices of the multi-stage charge pump, by preventing the controlled output voltage from undergoing excessively abrupt variations, that could damage the transistors of the last stage of the charge pump.

Multi-stage charge pump voltage generator with protection of the devices of the charge pump

A charge pump is proposed. The charge pump is integrated in a chip of semiconductor material and includes a plurality of capacitive elements each one connected to a corresponding circuit node of the charge pump, the circuit nodes being arranged in a sequence from an input node to an output node, a plurality of field effect transistors each one for selectively connecting a corresponding first circuit node with a second adjacent circuit node, each transistor being made in a corresponding insulated body region, and for each transistor first biasing means for equalizing the body region with the first circuit node when the transistor is closed, wherein for each transistor the charge pump further includes second biasing means for equalizing the body region with the second circuit node when the transistor is opened.

Charge-pump with improved biasing of the body regions of the pass-transistors

A single-stage clock booster produces a boosted clock voltage on an output node that is a multiple of a supply voltage. The single-stage clock booster includes a pump capacitor having a first terminal being driven by a first control phase signal. A first switch is controlled by the boosted clock voltage for connecting a second terminal of the pump capacitor to the supply voltage during a charge phase. A second switch connects the second terminal of the pump capacitor to the output node during a boosted clock voltage output phase. A switching circuit alternately connects a control node of the second switch to the supply voltage and to the first terminal of the pump capacitor. The switching circuit is driven by a second control phase signal. A third switch is controlled by a third control phase signal for connecting the output node to a reference voltage during the charge phase.

Single-stage and modular multi-stage clock-booster

A variable charge pump contains several individual simple charge pumps, each with a pumping capacitor and a switching mechanism. Additionally, a switching network is coupled to the individual charge pumps so that the different lines in the charge pump can be connected together in a serial mode or parallel mode (or mixed serial and parallel modes) to match the needs of the output load. The switching network is easily changed to provide the necessary driving capability as the needs of the output load changes.

Variable stage charge pump

A circuit for detecting signals present on a bifilar voltage-supply and signal-transmission line, in which the signals are constituted by positive and negative variations of the supply potential of at least one of the wires of the line, the circuit including a low-pass filter connected to the two wires of the line in order to supply, at an output terminal of the filter, a constant reference potential substantially equal to the supply potential of a preselected one of the two wires, a first threshold comparator having a reference input terminal and a threshold input terminal connected, respectively, to the output terminal of the filter and to the preselected wire of the two wires, and a second threshold comparator having a reference input terminal and a threshold input terminal connected, respectively, to the preselected wire of the two wires and to the output terminal of the filter. The circuit is relatively simple, does not require synchronization signals, and can be formed as an integrated circuit, taking up a limited area.

Circuit for detecting digital signals, particularly for a system with an ASI field bus

A data output buffer includes an output node, and a first stage connected to the output node for providing a first control signal for precharging the output node to an intermediate voltage with respect to a voltage for switching the output node from a current logic state to a different logic state. A second stage is connected to the first stage and to the output buffer. The first and second stages are responsive to a second control signal for enabling output of new data. A precharge logic circuit precharges the output node to the intermediate voltage as a function of data last output, and as a function of first and second reset signals until a rising and falling edge of the data last output respectively crosses the intermediate voltage.

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Catania, Italy

Gaetano Palumbo