Bioaxial Sas

California Institute of Technology

University of California

France Telecom

Etat Francais Represente Par Le Ministre Des Postes, Telecommunications

Etat Francais (centre National D'etudes Des Telecommunications)

Specrys Ltd.

Etat Francais, Represente Par Le Ministre Des Postes, Telecommunication

Bioaxial

Gabriel Y Sirat

Demetri Psaltis

Lionel Moisan

Eric Dufresne

Daniel Neuhauser

Pierre Chavel

Didier Charlot

David Marx

Henri Maitre

Kalman Wilner

Clément Fallet

Maxime Dubois

David Vaknin

Louis Philippe Braitbart

Alain Maruani

Julien Caron

Aharon Agranat

Methods for determining a value of an intrinsic geometrical parameter of a geometrical feature characterizing a physical object, and for classifying a scene into at least one geometrical shape, each geometrical shape modeling a luminous object. A singular light distribution characterized by a first wavelength and a position of singularity is projected onto the physical object. Light excited by the singular light distribution that has interacted with the geometrical feature and that impinges upon a detector is detected and a return energy distribution is identified and quantified at one or more positions. A deep learning or neural network layer may be employed, using the detected light as direct input of the neural network layer, adapted to classify the scene, as a plurality of shapes, static or dynamic, the shapes being part of a set of shapes predetermined or acquired by learning.

Superresolution metrology methods based on singular distributions and deep learning

A super resolution technique, intended mainly for fluorescence microscopy, acquires the three-dimensional position of an emitter, through a hybrid method, including a number of steps. In a first step the two-dimensional position of an emitter is acquired, using a technique, named in this application as an Abbe's loophole technique. In this technique a doughnut, or a combination of distributions, having a zero intensity at the combined center of the distributions, is projected onto the sample containing the emitter, under conditions wherein the doughnut null is moved towards the emitter to reach a position in which the emitter does not emit light. In a second step, an axial measurement is obtained using a 3D shaping method, characterized by the fact that the emitted light is shaped by an additional optical module creating a shape of the light emitted by the emitter, this shape being dependent of the axial position and means to retrieve the axial position from the shape.

Dark tracking, hybrid method, conical diffraction microscopy and dark addressing

A method of optical measurement for determining a spatial position of at least one luminous object in a sample includes: projecting onto the sample a dynamically optimized sequence of compact luminous distributions of different topological families; wherein the dynamically optimized sequence is determined based on data selected from the group consisting of a positioning hypothesis and a first set of measures; for each compact luminous distribution in the optimized sequence, generating an image of the at least one luminous object as illuminated thereby; and algorithmically analyzing the generated images to obtain spatial position information of the at least one luminous object.

Method and device for superresolution optical measurement using singular optics

An achromatic 3D STED measuring optical process and optical method, based on a conical diffraction effect or an effect of propagation of light in uniaxial crystals, including a cascade of at least two uniaxial or conical diffraction crystals creating, from a laser source, all of the light propagating along substantially the same optical path, from the output of an optical bank to the objective of a microscope. A spatial position of at least one luminous nano-emitter, structured object or a continuous distribution in a sample is determined. Reconstruction of the sample and its spatial and/or temporal and/or spectral properties is treated as an inverse Bayesian problem leading to the definition of an a posteriori distribution, and a posteriori relationship combining, by virtue of the Bayes law, the probabilistic formulation of a noise model, and possible priors on a distribution of light created in the sample by projection.

Optical measuring device and process

A method for measuring a position of a fluorophore includes configuring a set of compact light distributions, the set having at least one member, each light distribution characterized by a center, so that there is substantially zero intensity at the center of the set of compact light distributions. The method additionally includes moving the set of compact light distributions in relation to a set of hypothesized positions of the fluorophore, detecting, in a plurality of locations corresponding to the hypothesized set of positions, a set of images; and estimating the position of the fluorophore, by determining from the set of images a set of parameters describing the position of the fluorophore using an inverse problem method.

An optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous object on a sample. A sequence of at least two compact luminous distributions of different topological families is projected onto the sample, and light re-emitted by the at least one luminous object is detected. At least one optical image is generated for each luminous distribution on the basis of the light detected. The optical images are analyzed to obtain spatiotemporal information regarding the light re-emitted by the at least one luminous object, or location of the at least one luminous object.

Dark tracking, hybrid method, conical diffraction microscopy, and dark addressing

An optical measurement method and an optical measurement device for determining the spatial or spatiotemporal distribution of a sample, the sample comprising at least one retransmission source retransmitting light depending on light projected onto the sample according to a predetermined law. The method has steps of projection onto the sample of at least two compact light distributions belonging to different topological families, which propagate along the same optical path; detection of the light retransmitted by said at least one retransmission source of the sample; generation of at least one optical image from the detected light; and algorithmic analysis of the optical images for obtaining location data on said at least one retransmission source.

Optical measurement method and device

An optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous object on a sample. A sequence of at least two compact luminous distributions of different topological families is projected onto the sample, and light re-emitted by the luminous object is detected. At least one optical image is generated for each luminous distribution on the basis of the light detected. The optical images are analyzed to obtain spatiotemporal information regarding the light re-emitted by the luminous object, or location of the luminous object.

Growing community of inventors

Paris, France

Gabriel Y Sirat