Growing community of inventors

Champaign, IL, United States of America

Gabriel Popescu

Average Co-Inventor Count = 3.01

ph-index = 7

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 271

Gabriel PopescuMichael S Feld (6 patents)Gabriel PopescuRamachandra Rac Dasari (6 patents)Gabriel PopescuZhuo Wang (6 patents)Gabriel PopescuAristide Dogariu (5 patents)Gabriel PopescuChanghuei Yang (4 patents)Gabriel PopescuAdam Wax (4 patents)Gabriel PopescuChristopher M Fang-Yen (3 patents)Gabriel PopescuLynford L Goddard (2 patents)Gabriel PopescuTakahiro Ikeda (2 patents)Gabriel PopescuHuafeng Ding (2 patents)Gabriel PopescuTaewoo Kim (2 patents)Gabriel PopescuMustafa A H Mir (2 patents)Gabriel PopescuS Derin Babacan (2 patents)Gabriel PopescuMikhail Eugene Kandel (2 patents)Gabriel PopescuPaul Scott Carney (1 patent)Gabriel PopescuMatthew B Wheeler (1 patent)Gabriel PopescuChris Edwards (1 patent)Gabriel PopescuMarcello Rubessa (1 patent)Gabriel PopescuAmir Arbabi (1 patent)Gabriel PopescuChristopher Fang-yen (1 patent)Gabriel PopescuRenjie Zhou (1 patent)Gabriel PopescuBasanta Bhaduri (1 patent)Gabriel PopescuHoa Pham (1 patent)Gabriel PopescuRaj Rajagopalan (1 patent)Gabriel PopescuTan Huu Nguyen (1 patent)Gabriel PopescuYuchen He (1 patent)Gabriel PopescuNahil A Sobh (1 patent)Gabriel PopescuTakahiro Ikeda (0 patent)Gabriel PopescuGabriel Popescu (23 patents)Michael S FeldMichael S Feld (56 patents)Ramachandra Rac DasariRamachandra Rac Dasari (19 patents)Zhuo WangZhuo Wang (7 patents)Aristide DogariuAristide Dogariu (18 patents)Changhuei YangChanghuei Yang (98 patents)Adam WaxAdam Wax (23 patents)Christopher M Fang-YenChristopher M Fang-Yen (7 patents)Lynford L GoddardLynford L Goddard (16 patents)Takahiro IkedaTakahiro Ikeda (9 patents)Huafeng DingHuafeng Ding (2 patents)Taewoo KimTaewoo Kim (2 patents)Mustafa A H MirMustafa A H Mir (2 patents)S Derin BabacanS Derin Babacan (2 patents)Mikhail Eugene KandelMikhail Eugene Kandel (2 patents)Paul Scott CarneyPaul Scott Carney (17 patents)Matthew B WheelerMatthew B Wheeler (11 patents)Chris EdwardsChris Edwards (3 patents)Marcello RubessaMarcello Rubessa (3 patents)Amir ArbabiAmir Arbabi (2 patents)Christopher Fang-yenChristopher Fang-yen (2 patents)Renjie ZhouRenjie Zhou (1 patent)Basanta BhaduriBasanta Bhaduri (1 patent)Hoa PhamHoa Pham (1 patent)Raj RajagopalanRaj Rajagopalan (1 patent)Tan Huu NguyenTan Huu Nguyen (1 patent)Yuchen HeYuchen He (1 patent)Nahil A SobhNahil A Sobh (1 patent)Takahiro IkedaTakahiro Ikeda (0 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. University of Illinois (12 from 2,340 patents)

2. Massachusetts Institute of Technology (6 from 8,369 patents)

3. Lucent Technologies Inc. (4 from 9,364 patents)

4. Hamamatsu-photonics K.k. (2 from 2,921 patents)

5. University of Central Florida Research Foundation, Inc. (1 from 1,309 patents)


23 patents:

1. 12067712 - Complex system for contextual mask generation based on quantitative imaging

2. 10256262 - System and method for Hilbert phase imaging

3. 10132609 - Gradient light interference microscopy for 3D imaging of unlabeled specimens

4. 9715098 - Sparse deconvolution spatial light microscopy in two and three dimensions

5. 9528817 - Systems and methods for phase measurements

6. 9454809 - Phase derivative microscopy module having specified amplitude mask

7. 9404857 - White light diffraction tomography of unlabeled live cells

8. 9255791 - Optically monitoring and controlling nanoscale topography

9. 9052180 - Spatial light interference tomography

10. 8928887 - Characteristic parameters of cells and tissue from quantitative phase imaging

11. 8837045 - Diffraction phase microscopy with white light

12. 8772693 - System and method for Hilbert phase imaging

13. 8520213 - Spatial light interference microscopy and fourier transform light scattering for cell and tissue characterization

14. 8334982 - Systems and methods for phase measurements

15. 8184298 - Spatial light interference microscopy and fourier transform light scattering for cell and tissue characterization

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as of
12/6/2025
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