Other

Hughes Electronics Corporation

G David Bacher

David D Nolte

David M Pepper

Gilmore Joseph Dunning

Marvin E Klein

Marvin B Klein

Meng P Chiao

Indrajit Lahiri

Kenneth Bacher

John Anthony Coy

A photo-EMF detector for the collection of photons includes a substrate formed of a photorefractive semiconductor and a plurality of interlaced electrode pairs disposed over the substrate. Each electrode pair includes two parallel electrodes defining an active area therebetween for the collection of photons. One electrode of each pair is disposed between an adjacent pair of electrodes and proximate one electrode of the adjacent pair, light from striking a substrate surface between proximate electrodes and outputs from each of the plurality of interlaced electrode pairs are collected.

Enhanced non-steady-state photo-induced electromotive force detector

Faults, dimensions and other characteristics of a material or structure are sensed by a coherent beam's reflection from the material during ultrasonic or very fast vibration. The reflected beam acquires a phase substantially different from its original phase and from the phase of a reference beam split from the common source beam. The reflected beam and the reference beam are superimposed by diffraction in a multiple quantum well adaptive holographic beamsplitter, and the superimposed beams are detected by a photodetector capable of detecting small interference changes from ultrasonic surface displacements or perturbations. An apparatus and method defining an improved homodyne interferometer for performing the method is described.

Homodyne interferometer and method of sensing material

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Santa Ana, CA, United States of America

G David Bacher