Centre National De La Recherche Scientifique

Electricite De France

Ecole Normale Superieure De Cachan

Centre National De La Recherche Scientifique-Cnrs

Ecole Normale Superieure De Paris-Saclay

Félix Latourte

Stéphane Roux

François Hild

Qiwei Shi

The invention relates to a method for processing images obtained by a diffraction detector, of a crystalline or polycrystalline material, in which a first image of the material is acquired in a state of reference as well as a second image of the material in a deformed state. The invention is characterised in that, in a calculator, during a first step (E, E), a current elastic deformation gradient tensor Fis given a value determined by calculation, during a second step (E), the current displacement field induced by the tensor Fis calculated, during a third step (E), third digital values of a deformed image {hacek over (g)}(x)=g(x+u(x)) corrected by the current displacement field are calculated, and during an iterative algorithm, iterations of the second and third steps (E, E, E) are carried out on modified values of the tensor r Funtil a convergence criterion is met in relation to the correction to the current value of F.

Method, device and program for processing diffraction images of a crystalline material

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Cherbourg, France

Félix Latourte