Mitsubishi Electric Corporation

Futoshi Okawa

Hiroyuki Nakamura

Koichi Arisawa

Kazunori Sakanobe

Hiroshi Ikarashi

Masato Handa

In a power converter apparatus, a first power converter circuit is configured of first power semiconductor devices, and a second power converter circuit is connected in parallel to the first power converter circuit, and is configured of second power semiconductor devices. A control circuit generates a control signal for controlling each power semiconductor device of the first and second power converter circuits. A timing control signal generator circuit compares a first amount of current flowing through the first power semiconductor devices with a second amount of current flowing through the second power semiconductor devices, and generate a timing control signal for controlling a timing of a rise or a fall of each of the control signals inputted to the first and second power converter circuits, based on a comparison result. A timing correction circuit controls the control signals to correct the timing of the rise or the fall thereof.

Power conversion apparatus configured to include plurality of power converter circuits of inverter circuits

A current detection device for detecting an electric current flowing through an inverter, an overcurrent level generation device for generating an abnormality judgment reference value, an overcurrent detection device for generating an interruption signal to the inverter on the basis of an output of the current detection device and the abnormality judgment reference value, and an adjusting apparatus for correcting the abnormality judgment reference value of the overcurrent level generation device on the basis of the output at a time when a constant electric current is applied to the current detection device are provided. The overcurrent level generating device is provided with one or a plurality of resistance value adjusting sections, and generates the abnormality judgment reference value in correspondence to a resistance value of the resistance value adjusting section. The adjusting apparatus performs a zapping operation by means of applying a reverse-bias to a zener diode, and corrects the abnormality judgment reference value.

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Tokyo, Japan

Futoshi Okawa