The University of Tokyo

Ihi Corporation

National Institute of Radiological Sciences

Fumito Sakamoto

Hiroyuki Nose

Daisuke Ishida

Namio Kaneko

Mitsuru Uesaka

Katsuhiro Dobashi

Yasuo Sakai

Masashi Yamamoto

An X-ray waveform is generated by validating detection data corresponding to when an X-ray () is generated at a collision point () among X-ray detection data and invalidating other data. For example, when laser light () is pulse laser light and an electron beam () is a continuous electron beam or a pulse-like electron beam having a pulse width equal to or greater than that of the pulse laser light, the X-ray waveform is generated by detecting the laser light () and multiplying the X-ray detection data by laser light detection data after making time axes coincident with respect to the collision point ().

X-ray metering apparatus, and X-ray metering method

A charged particle beam decelerating device includes a high-frequency cavityprovided on an orbit of a charged particle beam, and a phase synchronizing devicefor synchronizing the charged particle beamin the high-frequency cavity with a phase of a high-frequency electric field. By moving the high-frequency cavityor changing an orbit length of the charged particle beam, the charged particle beam in the high-frequency cavity is synchronized with a phase of the high-frequency electric field

Charged particle beam decelerating device and method, and X-ray generating apparatus using the same

A high brightness X-ray generator and a high brightness X-ray generating method are provided which are able to promote an increase in X-ray brightness (i.e., an increase in an X-ray output) while suppressing an excessive increase in the cost of optical elements such as a laser unit, a mirror, and a lens. A high brightness X-ray generator generates an X-ray by inverse Compton scattering by colliding an electron beam with pulse laser light. There are provided a plurality of pulse laser units (A,B) which emits a plurality of pulse laser lights (a,b ) in predetermined periods, an optical-path matching unit () which matches optical paths of the plurality of pulse laser lights, and a timing control unit () which controls timings of the optical-path matching unit and the pulse laser units, wherein the plurality of pulse laser lights is emitted from the same optical path at different timings.

High brightness X-ray generating device and method

An electron beam detection device () is arranged on an electron beam passing path so that a beam delay time tfrom a passing moment of an electron beam () to a moment when the beam reaches a predicted collision point () is longer than a laser delay time tfrom a moment when a command for generating laser light () is issued to the moment when the laser light reaches the predicted collision point () by at least a predetermined delay time &#x394;t. The device () may detect passing therethrough without affecting the electron beam and output a laser light generation command from a laser light command delay circuit () when the predetermined delay time &#x394;t (=t&#x2212;t) has elapsed after the detection.

Device and method for adjusting collision timing between electron beam and laser light

A device for measuring profiles of an electron beam and a laser beam is provided with a profile measuring devicefor measuring cross-section profiles of the beams in the vicinity of a collision position where an electron beamand a laser beamare brought into frontal collision, and a moving devicefor continuously moving the profile measuring device in a predetermined direction which substantially coincides with the axial directions of the beams. Furthermore, based on the cross-section profiles measured by the profile measuring device, the position of the profile measuring device in the predetermined direction, and the oscillation timings of the beams, temporal changes in three-dimensional profiles of the electron beam and the laser beam are created by a profile creating device

Growing community of inventors

Tokyo, Japan

Fumito Sakamoto