Jasco Corporation

Fuminori Sato

Yoshihito Narita

Tsutomu Inoue

Shigeyuki Kimura

Atsushi Yamada

Mutsumi Senuma

Tohru Sakamaki

Norihito Hujiwara

A near-field polarized-light measurement apparatuscomprises a near-field probe, an analyzer, a detector, and an analyzer-rotating unit. The near-field probehas at a tip thereof an opening smaller than the wavelength of light used for measurement and generates linearly polarized near-field light from the opening and irradiates a sample with the near-field light. The detectordetects light transmitted through the sample via the analyzer. The analyzer-rotating unitrotates the analyzerabout an optical axis to vary the angle of a transmission axis thereof. And optical rotation of the sample is measured by rotating the analyzerwith the analyzer-rotating unit

Near-field polarized-light measurement apparatus

A near field analysis apparatus comprising: an irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the irradiation-side adjustable optical system; a light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the light-collection-side adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the irradiation-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the light-collection-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.

Near field analysis apparatus having irradiation-side guide light and light-collection-side guide light

An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source ; reflection means , light detection means ; press means pressing a probe tip against said reflection means; storage means ; calculation means figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.

Probe opening fabricating apparatus, and near-field optical microscope using the same

An opening fabricating apparatus for creating an opening with desired dimensions at a mask tip of a near-field optical microscope, and a near-field optical microscope using the same are provided. The apparatus comprising: a light source ; reflection means ; light detection means ; press means pressing a probe tip against said reflection means; storage means ; calculation means figuring out the quantity of light of the reflected light for the acquisition of said opening with desired dimensions from the calibration information stored in said storage means; and press control means controlling pressing of said probe tip against said reflection means so as to allow the quantity of light of said reflected light to become equal to the quantity figured out by said calculation means. The probe opening fabricating apparatus is capable of readily fabricating an opening of desired dimensions with a high reproducibility.

The near-field spectrometer comprises a Z-axis scanner for bringing a sample and the tip of a probe close to each other at a predetermined distance within a near-field region when obtaining near-field spectral information and separating them from each other at a predetermined distance outside a near-field region when obtaining back ground spectral information, and a data processor for obtaining the true near-field spectral information free from the background by subtracting the background spectral information from the near-field spectral information, characterized in that a background information collector, during the separation of the sample and the tip of the probe at a predetermined distance outside the near-field region, obtains the background spectral information for the corresponding portion to be measured.

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Hachioji, Japan

Fuminori Sato