Growing community of inventors

Yokohama, Japan

Fuminobu Komura

Average Co-Inventor Count = 3.44

ph-index = 13

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 519

Fuminobu KomuraKoichi Homma (8 patents)Fuminobu KomuraMakoto Kato (4 patents)Fuminobu KomuraToshihiro Furuya (4 patents)Fuminobu KomuraYouichi Seto (4 patents)Fuminobu KomuraTakatoshi Kodaira (3 patents)Fuminobu KomuraAkira Maeda (2 patents)Fuminobu KomuraTakashi Hino (2 patents)Fuminobu KomuraHirotaka Mizuno (2 patents)Fuminobu KomuraMasatoshi Furuya (2 patents)Fuminobu KomuraKenji Fujii (1 patent)Fuminobu KomuraTetsuo Yokoyama (1 patent)Fuminobu KomuraTakanori Shibata (1 patent)Fuminobu KomuraTakashi Iizumi (1 patent)Fuminobu KomuraMasahiro Kikuchi (1 patent)Fuminobu KomuraToshiro Sasaki (1 patent)Fuminobu KomuraMichitaka Kosaka (1 patent)Fuminobu KomuraKunio Takada (1 patent)Fuminobu KomuraAkira Kagami (1 patent)Fuminobu KomuraKuniaki Matsumoto (1 patent)Fuminobu KomuraKoichi Haruna (1 patent)Fuminobu KomuraShimbu Yamagata (1 patent)Fuminobu KomuraYutaka Kubo (1 patent)Fuminobu KomuraYutaka Takuma (1 patent)Fuminobu KomuraHiromitsu Kurisu (1 patent)Fuminobu KomuraHideo Ota (1 patent)Fuminobu KomuraYoji Matsuoka (1 patent)Fuminobu KomuraShu Tezuka (1 patent)Fuminobu KomuraShinobu Otsuka (1 patent)Fuminobu KomuraAkira Tsuboi (1 patent)Fuminobu KomuraHiromi Kashiwabara (1 patent)Fuminobu KomuraKoichi Moriguchi (1 patent)Fuminobu KomuraYoshikazu Hirayama (1 patent)Fuminobu KomuraKouji Ueda (1 patent)Fuminobu KomuraFuminobu Komura (17 patents)Koichi HommaKoichi Homma (16 patents)Makoto KatoMakoto Kato (93 patents)Toshihiro FuruyaToshihiro Furuya (13 patents)Youichi SetoYouichi Seto (5 patents)Takatoshi KodairaTakatoshi Kodaira (6 patents)Akira MaedaAkira Maeda (53 patents)Takashi HinoTakashi Hino (19 patents)Hirotaka MizunoHirotaka Mizuno (13 patents)Masatoshi FuruyaMasatoshi Furuya (3 patents)Kenji FujiiKenji Fujii (158 patents)Tetsuo YokoyamaTetsuo Yokoyama (52 patents)Takanori ShibataTakanori Shibata (46 patents)Takashi IizumiTakashi Iizumi (29 patents)Masahiro KikuchiMasahiro Kikuchi (24 patents)Toshiro SasakiToshiro Sasaki (24 patents)Michitaka KosakaMichitaka Kosaka (17 patents)Kunio TakadaKunio Takada (17 patents)Akira KagamiAkira Kagami (15 patents)Kuniaki MatsumotoKuniaki Matsumoto (15 patents)Koichi HarunaKoichi Haruna (12 patents)Shimbu YamagataShimbu Yamagata (12 patents)Yutaka KuboYutaka Kubo (5 patents)Yutaka TakumaYutaka Takuma (5 patents)Hiromitsu KurisuHiromitsu Kurisu (4 patents)Hideo OtaHideo Ota (3 patents)Yoji MatsuokaYoji Matsuoka (3 patents)Shu TezukaShu Tezuka (2 patents)Shinobu OtsukaShinobu Otsuka (2 patents)Akira TsuboiAkira Tsuboi (1 patent)Hiromi KashiwabaraHiromi Kashiwabara (1 patent)Koichi MoriguchiKoichi Moriguchi (1 patent)Yoshikazu HirayamaYoshikazu Hirayama (1 patent)Kouji UedaKouji Ueda (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Hitachi, Ltd. (15 from 42,485 patents)

2. Other (1 from 832,680 patents)

3. Hitachi Software Engineering Company, Ltd. (1 from 228 patents)


17 patents:

1. 7027653 - Variation detecting apparatus, variation detecting method, and storage medium and system for storing program involved in the method

2. 6810153 - Method for orthocorrecting satellite-acquired image

3. 5870730 - Decision making method

4. 5812421 - System for cooperatively operating river management facilities

5. 5689233 - Emergency information offering system

6. 5550742 - Scheduled motion planning method and apparatus for a vehicle

7. 5546572 - Method for retrieving database of image information

8. 5311173 - Navigation system and method using map data

9. 5001344 - Scanning electron microscope and method of processing the same

10. 4912770 - Method of detecting change using image

11. 4912313 - Method of measuring surface topography by using scanning electron

12. 4907287 - Image correction system for scanning electron microscope

13. 4803358 - Scanning electron microscope

14. 4758838 - Method of reconstructing images from synthetic aperture radar's data

15. 4700398 - Method of and apparatus for detecting heights of points on surface of

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