Japan Science and Technology Corporation

Fumikazu Inuzuka

Kazuhiko Misawa

Hiroyoshi Lang

A time resolved, nonlinear complex susceptibility measuring apparatus () that is capable of measurement unaffected by any distortion of the wave front of a probe light whereby a temporal change in the nonlinear complex susceptibility of a nonlinear optical material that occurs when it is irradiated with a light pulse in a femtosecond range is measured using a pair of polarized lights orthogonal to each other which are formed by splitting a single light pulse into a reference and a probe light () and () in a polarized light splitting Sagnac type interference light path (). A direction of polarization converting mechanism for rotating a direction of polarization of the reference and probe lights by an angle of 90&#xb0; in the polarized light splitting Sagnac type interference light path is included to align the directions of polarization on a test specimen (). A phase difference between the reference and probe lights which are output from the polarized light splitting Sagnac type interference light path is swept by a phase difference sweep mechanism () whereby a time resolved, nonlinear complex susceptibility is found from a phase difference sweep interference waveform obtained by measuring the intensity of interference light between the reference and probe lights for each of such phase differences swept.

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Kanagawa, Japan

Fumikazu Inuzuka