Hitachi High-Tech Corporation

Fumihiro Bekku

Takefumi Kakinuma

Yasutaka Toyoda

Masayoshi Ishikawa

Shinichi Shinoda

Shuyang Dou

Sota Komatsu

The objective of the present invention is to provide an image classification device and a method therefor with which suitable teaching data can be created. An image classification device that carries out image classification using images which are in a class to be classified and include teaching information, and images which are in a class not to be classified and to which teaching information has not been assigned, said image classification device being characterized by being provided with: an image group input unit for receiving inputs of an image group belonging to a class to be classified and an image group belonging to a class not to be classified; and a subclassification unit for extracting a feature amount for each image in an image group, clustering the feature amounts of the images in the image group belonging to a class not to be classified, and thereby dividing the images into sub-classes.

Image classification device and method

The purpose of the present invention is to provide an image evaluation device and method which can detect unknown defects and which can prevent misrecognition by a machine learning model. This image evaluation device, which uses a machine learning classifier to classify defect information in a defect image of an electronic device, is characterized by being provided with: an image storage unit which stores a defect image of an electronic device; a defect region storage unit which stores defect region information that is in the defect image; a classifier which classifies the defect information with machine learning; an image extraction unit which, in the course of the defect image classification processing, extracts image-of-interest information which the classifier will focus on; and an evaluation unit which compares the image-of-interest information and the defect region information to evaluate the classifiability of the defect image.

Image evaluation apparatus and image evaluation method

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Tokyo, Japan

Fumihiro Bekku