Micron Technology Incorporated

Fulvio Rori

Giuseppe Cariello

Chiara Cerafogli

Scott Anthony Stoller

Pitamber Shukla

Jonathan W Oh

Marco Domenico Tiburzi

Justin Bates

David Aaron Palmer

Jung Sheng Hoei

Preston Allen Thomson

Qisong Lin

Liang Yu

Andrea D'Alessandro

Jason Lee Nevill

John Paul Aglubat

Jonathan Wen Jian Oh

Shannon Marissa Hansen

Kishore Kumar Muchherla

Ching-Huang Lu

Walter Di Francesco

Antonino Pollio

Carmine Miccoli

Tawalin Opastrakoon

Jiun-Horng Lai

Bin Wang

Allison Jayne Olson

Sriteja Yamparala

Tarun Singh Yadav

Attila A Herrera

Aaron James Olson

Ryan Hrinya

Wai Ying Lo

Methods, systems, and devices for suspending operations of a memory system are described. A memory system may be configured to perform a write operation to store data in a nonvolatile memory device, where the write operation includes storing information in one or more latches associated with the nonvolatile memory device; receive a suspend command to suspend performance of the write operation based on a request to perform a read operation associated with a higher-priority than the write operation; suspend the performance of the write operation based on receiving the suspend command; transmit the information stored in the one or more latches associated with the nonvolatile memory device to a host system based on suspending the performance of the write operation; and perform the read operation based at least in part on transmitting the information to the host system.

Suspending operations of a memory system

Methods, systems, and devices for improved efficiency for consecutive read operations are described. For example, a memory system may receive a first command indicating a first read operation in a block of memory cells that are each configured to store more than one bit. In response to receiving the first command, the memory system may initiate the performance of the first read operation by applying a voltage to a set of access lines associated with the block of memory cells. The memory system may additionally receive a second read command indicating a second, consecutive read operation in the block of memory cells, where the second command includes an indication to refrain from discharging the set of access lines. Here, the memory system may initiate the performance of the second read operation without first discharging the set of access lines after the performance of the first read operation.

Efficiency for consecutive read operations

Aspects of the present disclosure configure a memory sub-system controller to adaptively allocate word lines (WLs). The controller accesses reliability data of a set of main WLs of a block of the set of memory components. The controller determines that one or more WLs of the set of main WLs of the block are associated with respective reliability data that transgress a threshold and, in response to determining that the one or more WLs are associated with the respective reliability data that transgress the threshold, replaces the one or more WLs of the set of main WLs of the block with one or more dummy WLs. The controller programs data into the block using the one or more dummy WLs instead of the one or more WLs of the set of main WLs of the block.

Dynamic word line allocation in memory systems

Memory systems with flexible erase suspend-resume operations are described herein. In one embodiment, a memory device is configured to receive an erase suspend command while a first erase pulse of an erase operation is at a flattop voltage. In response, the memory device suspends the erase operation. The memory device further resumes the erase operation such that a second erase pulse of the erase operation is ramped to the flattop voltage. Absent intervening erase suspend operations, erase operations of the memory device can include a single erase pulse that remains at the flattop voltage for a total duration. A first total duration plus a second total duration the first and second erase pulses, respectively, remain at the flattop voltage remains less than or equal to the total duration the single erase pulse remains at the flattop voltage.

Memory systems with flexible erase suspend-resume operations, and associated systems, devices, and methods

Methods, systems, and devices for suspend operations are described. A memory device may perform a write operation including one or more programming phases and one or more verify phases. The memory device may receive a read command while performing the write operation and determine whether the verify phase of the write operation is complete. The memory device may suspend a performance of the write operation in response to determining that the verify phase of the write operation is complete. The memory device may transmit first information for the write operation from a first latch to a volatile memory device in response to suspending the performance of the write operation. The memory device may perform a read operation associated with the read command in response to suspending the performance of the write operation and transferring the first information.

Techniques for suspend operations

The progress of an erase operation for a memory device is monitored using an erase credit mechanism. In one approach, an erase operation is performed to erase a memory. Erase pulse slices used in the erase operation are monitored. Erase credits associated with the erase operation are determined. The erase credits include an erase credit associated with each of the erase pulse slices. Based on the erase credits, an extent of erasure of the memory is determined. In response to determining that the extent of erasure has reached a predetermined threshold, the erase operation is terminated.

Monitoring flash memory erase progress using erase credits

Devices and techniques for NAND temperature-aware operations are disclosed herein. A device controller can receive a command to write data to a component in the device. A temperature corresponding to the component can be obtained in response to receiving the command. The command can be executed by the controller to write data to the component. Executing the command can include writing the temperature into a management portion of the device that is separate from a user portion of the device to which the data is written.

NAND temperature-aware operations

An example method includes, performing a first erase verify on a first set of memory cells of a portion of an array of memory cells, performing a second erase verify on a second set of memory cells of the portion of the array, applying a first erase voltage pulse concurrently to each memory cell in the portion of the array if the first set fails the first erase verify and if the second set fails the second erase verify, and applying a second erase voltage pulse concurrently to each memory cell in the portion of the array if the first set passes the first erase verify and if the second set fails the second erase verify. The second erase voltage pulse is different than the first erase voltage pulse.

Apparatus and method of performing erase and erase verify operations

Various embodiments of the present disclosure relate to monitoring the integrity of power signals within memory systems. A method can include receiving a power signal at a memory component, and monitoring, via a power signal monitoring component of the memory component, an integrity characteristic of the power signal. Responsive to the integrity characteristic meeting a particular criteria, the method can include providing a status indication to a control component external to the memory component.

Power integrity monitoring

Apparatus and methods are disclosed, including receiving an indication to selectively erase first data stored on a first page of a first subset of a group of multi-level memory cells of the storage system, each multi-level memory cell comprising multiple pages and providing, in response the indication to selectively erase the first data, at least one soft erase pulse to the first page of memory cells associated with the first data to induce distribution overlap across different bit levels of the first page of the group of multi-level memory cell.

Modified erase

A variety of applications can include a memory device designed to perform sensing of a memory cell of a string of memory cells using a modified shielded bit line sensing operation. The modified shielded bit line sensing operation includes pre-charging a data line corresponding to the string with the string enabled to couple to the data line. The modified shielded bit line sensing operation can be implemented in a hybrid initialization routine for the memory device. The hybrid initialization routine can include a sensing read routine corresponding to an all data line configuration of data lines of the memory device and a modified sensing read routine corresponding to a shielded data line configuration of the data lines with selected strings enabled during pre-charging. A read retry routine associated with the modified sensing read routine can be added to the hybrid initialization routine. Additional devices, systems, and methods are discussed.

Hybrid routine for a memory device

Methods, systems, and devices for programming multi-level memory cells are described. After a first pass, an offset in the form of one or more offset pulses, may be applied to MLCs that are in a state of a higher level. The offset may be applied before or during a first part of a second pass. The offset may move the signals of the cells before the cells are finally programmed so as to avoid potential overlaps between the unprogrammed cells and cells that are programmed to the lower half of the final levels during the second pass. The offset cells may then be further moved to the other levels in the higher half of the final levels.

Programming multi-level memory cells

A programmable memory device includes a ROM block to store instructions associated with functionality of the programmable memory device, a memory array having reserved pages to store updates to be performed on the ROM block, and a controller coupled to the ROM block and the memory array. The controller is to, in response to receipt of a remote command from a vendor server via a host system, execute the instructions to perform operations including: executing a set features command to access the set of reserved pages, as an extension to one time programmable mode; programming a set of sub-feature parameters to a specified feature address of the reserved pages, where the set of sub-feature parameters are to trigger operation within a ROM-emulated memory (REM) profile mode; and programming a REM-profiled page of the reserved pages with REM data received from the vendor server via the host system.

Read only memory (ROM)-emulated memory (REM) profile mode of memory device

A portion of a memory management operation associated with a first current level that satisfies a condition pertaining to a threshold current level and a second current level that satisfies the condition pertaining to the threshold current level is identified. Mask data associated with the portion of the memory management operation is identified. Based on the mask data, a current management action is performed during execution of a requested memory management operation received from a host system.

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Boise, ID, United States of America

Fulvio Rori