Taiwan Semiconductor Manufacturing Comp. Ltd.

Fu-Kang Lai

Yi-Chin Hsu

Ta-Chin Lin

Yao-Tung Liu

Yi-Feng Huang

Ming-Hsiu Hsieh

Yi-Hsin Chan

Wen-Feng Wu

Jen-Chih Hsiao

A method and system for flexible, comprehensive, on-line, real-time dynamic lot dispatching in a semiconductor test foundry based on a two-phased, event-driven dispatching system structure. An adjustable priority formula and tuned algorithms integrated with PROMIS' constraint function give a nearly optimum dispatching list on any tester at any time with reduced mistake operations. Exception rules take care of special events to improve daily dispatching manual effort. This invention can automatically dispatch engineering lots according to engineering lots' capacity of Testing, solve conflict between wafer and package lots, efficiently reduce tester setup times, replace daily manual-dispatching sheet and keep a high CLIP rate while fully following MPS.

Algorithms tunning for dynamic lot dispatching in wafer and chip probing

To allocate products for machines on a manufacturing line, provide a standard test time. Minimize total test time with respect to production scheduling. Form a supply demand matrix table for products and machines for product allocation. Find the grid location with minimum testing time. Provide maximum time allocation from a machine at the corresponding position on the matrix table. Determine the grid location with the next minimum testing time. Loop back to provide a maximum allocation of remaining time from the corresponding machine and repeat looping back until no demand is left. Find need for an optimum testing process by testing whether only one machine can test the product and no quantity is allocated to a machine. If YES branch to calculate utilization per machine. If NO, decide whether N &plus;N &equals;NV . If YES perform optimum testing. If NO, branch to calculate machine utilization per machine.

Method for minimizing total test time for testing factories

Growing community of inventors

Hsin-Chu, Taiwan

Fu-Kang Lai