Industrial Technology Research Institute

Fu-Cheng Yang

Yi-Sha Ku

Chih-Hsiang Liu

Chia-Hung Cho

Kai-Ping Chuang

Chien-Wen Chen

Yi-Chen Hsieh

Pei-Wen Yen

Shu-Ping Dong

Chia-Liang Yeh

Mao-Sheng Huang

Po-Yi Chang

Wei-Hsiung Tsai

Yeou-Sung Lin

Chih-Shang Liu

Keng-Li Lin

Chih-Jung Chiang

A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.

Three-dimension measurement device and operation method thereof

A positioning measurement device is provided. The device includes a light source, a grating, and plural light sensors. A periodic light field is generated by light emitted by the light source and passes through the grating to. The plural light sensors are periodically spaced. The light sensors are used to sense the periodic light field for generating a plurality of positioning measurement signals.

Positioning measurement device and the method thereof

A device and method for detecting crystal quality of a low temperature poly-silicon (LTPS) backplane are provided, the method including: projecting narrowband light to the LTPS backplane; performing image capturing of each position on a surface of the LTPS backplane at a first angle in a first axial direction to obtain a first diffraction image, the first angle being an angle of maximum diffraction light intensity in the first axial direction; performing another image capturing of each position on the surface of the LTPS backplane at a second angle in a second axial direction to obtain a second diffraction image, the second angle being an angle of maximum diffraction light intensity in the second axial direction; and determining the crystal quality of the LTPS backplane based on a diffraction light intensity distribution obtained from the first and second diffraction images.

Quality detecting device and method

The disclosure provides an inspection device including a light source module, an image receiving module and a processing unit. The light source module emits a first incident light and a second incident light to a device under test (DUT). The image receiving module receives a first image corresponding to the DUT irradiated by the first incident light, and receives a second image corresponding to the DUT irradiated by the second incident light. The processing unit calculates the contrast ratio of the first image and the second image to obtain a high-contrast image for inspection.

Inspection device and inspection method

A system for measuring the rotation angle of optical active substances has a light source, a polarization generation unit; a polarization analyzing unit; a signal generating unit, respectively and electrically coupled to the polarization generation unit and the polarization analyzing unit; a signal processing unit, electrically coupled to the electric signal generating unit; wherein the light source is enabled to emit a beam toward the polarization generation unit for enabling the beam to be polarized into an incident polarized beam while being projected and traveled in an optical path passing through an optical active substance so as to be converted into a emerging beam; and the polarization analyzing unit is positioned to receive and analyze the emerging beam so as to generate a signal to be received and processed by the signal processing unit.

System and method for measuring the rotation angle of optical active substance

Growing community of inventors

Hsinchu County, Taiwan

Fu-Cheng Yang