Zetec, Inc.

Frederic Morrow

Alexandre Charlebois

Stephane Turgeon

Martin Garneau

Jean-Francois Tremblay

Laurent Enenkel

Daniel Richard

Dirk Verspeelt

Guy Maes

A system for displaying an area covered in a non-destructive scan of an area larger than the test probe is disclosed. Position encoders are included on the test probe to track the motion of the probe and to provide a record of the portion of the area under test that has been covered by the probe.

System for display of non-destructive testing region

A method of establishing position dependent focal laws and dynamically accessing these focal laws during inspection is disclosed comprising the steps of partitioning a CAD model into distinct geometric regions prior to inspection, generating a dedicated set of focal laws for each of the geometric regions, and associating each position of the scanner with one of the geometric regions. A method of compressing an A-Scan using a windowing technique is also disclosed. Additionally, methods for computing and displaying volumetric slices in real-time are disclosed. Finally, a method of firing multiple probes at different firing frequencies is disclosed, as well as a multi-probe inspection system that enables parallel firing.

System and method for ultrasonic testing

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St-Jean-Chrysostome, Canada

Frederic Morrow