Safran

Centre National De La Recherche Scientifique

Commissariat &#xc0; L'&#xc9;nergie Atomique Et Aux &#xc9;nergies Alternatives

Frederic Jenson

Mathieu Loic Ducousso

Bastien Jacques Chapuis

Claire Prada

Aurélien Baelde

Guillemette Danielle Joelle Marie Ribay

Laura Taupin

The invention concerns a method for the non-destructive mapping of a component, in order to determine an elongation direction of the elongate microstructure of the component at at least one point of interest, characterised in that it comprises at least two successive intensity measurement steps comprising the following steps: a sub-step of rotating a linear transducer into a plurality of angular positions, said linear transducer comprising a plurality of transducer elements, a sub-step of emitting a plurality of elementary ultrasonic beams at each angular position, a sub-step of measuring a plurality of backscattered signals resulting from the backscattering of the elementary ultrasonic beams by said elongate microstructure, the intensity measurement steps making it possible to obtain two series of intensities measured according to two axes of rotation, and in that the method comprises a step of combining the measured series of intensities so as to determine the elongation direction of the microstructure at said at least one point of interest.

Method and device for mapping components for detecting elongation direction

A method of non-destructively inspecting an adhesively bonded assembly of first, second, and third materials includes generating guided waves in the adhesively bonded assembly and establishing a dispersion curve plot in a first reference frame on the basis of receiving the guided waves. The method further includes comparing the dispersion curve plot with a plurality of reference dispersion curves established in the first reference frame, each of the reference dispersion curves being obtained by generating guided waves in a reference adhesively bonded assembly. Finally, the method includes estimating at least one of the thicknesses of the materials in the adhesively bonded assembly under inspection.

Method of inspection by guided waves

A characterization device for non-destructively characterizing a material includes emitter/receiver cells, each cell being able, in an emit mode, to emit ultrasound waves towards the material for characterizing, and, in a receive mode, to receive ultrasound waves that have been transmitted through the material. The non-destructive characterization device includes a ring made up of a plurality of adjacent angular sectors, each angular sector including ultrasound cells stacked in a radial direction of the ring.

Device and a method for non-destructively characterizing a material

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Moissy-Cramayel, France

Frederic Jenson