Growing community of inventors

Meylan, France

Frederic J Neuveux

Average Co-Inventor Count = 4.24

ph-index = 7

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 113

Frederic J NeuveuxRohit Kapur (7 patents)Frederic J NeuveuxThomas W Williams (7 patents)Frederic J NeuveuxEmil I Gizdarski (7 patents)Frederic J NeuveuxSuryanarayana Duggirala (7 patents)Frederic J NeuveuxNodari Sitchinava (7 patents)Frederic J NeuveuxSamitha Samaranayake (7 patents)Frederic J NeuveuxPeter Wohl (6 patents)Frederic J NeuveuxJohn A Waicukauski (6 patents)Frederic J NeuveuxSalvatore Talluto (2 patents)Frederic J NeuveuxSorin Ioan Popa (1 patent)Frederic J NeuveuxYasunari Kanzawa (1 patent)Frederic J NeuveuxGregory A Maston (1 patent)Frederic J NeuveuxAndrea Costa (1 patent)Frederic J NeuveuxLeela Krishna Thota (1 patent)Frederic J NeuveuxFrederic J Neuveux (15 patents)Rohit KapurRohit Kapur (41 patents)Thomas W WilliamsThomas W Williams (30 patents)Emil I GizdarskiEmil I Gizdarski (25 patents)Suryanarayana DuggiralaSuryanarayana Duggirala (13 patents)Nodari SitchinavaNodari Sitchinava (7 patents)Samitha SamaranayakeSamitha Samaranayake (7 patents)Peter WohlPeter Wohl (31 patents)John A WaicukauskiJohn A Waicukauski (25 patents)Salvatore TallutoSalvatore Talluto (5 patents)Sorin Ioan PopaSorin Ioan Popa (3 patents)Yasunari KanzawaYasunari Kanzawa (2 patents)Gregory A MastonGregory A Maston (1 patent)Andrea CostaAndrea Costa (1 patent)Leela Krishna ThotaLeela Krishna Thota (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Synopsys, Inc. (15 from 2,485 patents)


15 patents:

1. 12352811 - Validating test patterns ported between different levels of a hierarchical design of an integrated circuit

2. 11132484 - Controlling clocks and resets in a logic built in self-test

3. 9157961 - Two-level compression through selective reseeding

4. 8645780 - Fully X-tolerant, very high scan compression scan test systems and techniques

5. 8464115 - Fully X-tolerant, very high scan compression scan test systems and techniques

6. 7979763 - Fully X-tolerant, very high scan compression scan test systems and techniques

7. 7958472 - Increasing scan compression by using X-chains

8. 7900105 - Dynamically reconfigurable shared scan-in test architecture

9. 7836367 - Dynamically reconfigurable shared scan-in test architecture

10. 7836368 - Dynamically reconfigurable shared scan-in test architecture

11. 7823034 - Pipeline of additional storage elements to shift input/output data of combinational scan compression circuit

12. 7774663 - Dynamically reconfigurable shared scan-in test architecture

13. 7743299 - Dynamically reconfigurable shared scan-in test architecture

14. 7596733 - Dynamically reconfigurable shared scan-in test architecture

15. 7418640 - Dynamically reconfigurable shared scan-in test architecture

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