Sas Institute Inc.

Frederic Combaneyre

Varunraj Valsaraj

Sanjeev Shyam Heda

Kedar Shriram Prabhudesai

Jonathan Lee Walker

Hamza Mustafa Ghadyali

Allen Joseph Langlois

Nabaruna Karmakar

A computing system detects a defective object. An image is received of a manufacturing line that includes objects in a process of being manufactured. Each pixel included in the image is classified as a background pixel class, a non-defective object class, or a defective object class using a trained neural network model. The pixels included in the image that were classified as the non-defective object class or the defective object class are grouped into polygons. Each polygon is defined by a contiguous group of pixels classified as the non-defective object class or the defective object class. Each polygon is classified in the non-defective object class or in the defective object class based on a number of pixels included in a respective polygon that are classified in the non-defective object class relative to a number of pixels included in the respective polygon that are classified in the defective object class.

Manufacturing defective object detection system

Growing community of inventors

Sainte-Colombe-Pres-Vernon, France

Frederic Combaneyre