Soitec

S.o.i.tec Silicon on Insulator Technologies

Commissariat &#xc0; L'&#xc9;nergie Atomique Et Aux &#xc9;nergies Alternatives

Commissariat a L'energie Atomique

Stmicroelectronics Gmbh

Frédéric Allibert

Sébastien Kerdiles

Christelle Veytizou

Isabelle Bertrand

Bich-Yen Nguyen

Oleg Kononchuk

Didier Landru

Carlos Mazure

Marcel Broekaart

Mohamad A Shaheen

Chrystel Deguet

Gweltaz Gaudin

Eric Desbonnets

Thomas Signamarcheix

Fabrice Lallement

Luciana Capello

Maud Vinet

Pierre Morin

Christophe Maleville

Walter Schwarzenbach

Ionut Radu

Emmanuel Augendre

Daniel Delprat

Patrick Reynaud

Frédéric Gaillard

Julie Widiez

Jean-Pierre Raskin

Lamia Nouri

Emmanuel Rolland

Young-Pil Kim

Damien Massy

François Brunier

Damien Radisson

Martin Rack

Thomas Lorne

Yvan Morandini

Eric Desbonnet

Karin Landry

Karine Landry

Aymen Ghorbel

The present disclosure relates to a multilayer semiconductor-on-insulator structure, comprising, successively from a rear face toward a front face of the structure: a semiconductor carrier substrate with high electrical resistivity, whose electrical resistivity is between 500 Ω·cm and 30 kΩ·cm, a first electrically insulating layer, an intermediate layer, a second electrically insulating layer, which has a thickness less than that of the first electrically insulating layer, an active semiconductor layer, the multilayer structure comprises: at least one FD-SOI region, in which the intermediate layer is an intermediate first semiconductor layer, at least one RF-SOI region, adjacent to the FD-SOI region, in which the intermediate layer is a third electrically insulating layer, the RF-SOI region comprising at least one radiofrequency component plumb with the third electrically insulating layer.

Semiconductor structure for digital and radiofrequency applications, and method for manufacturing such a structure

A handle substrate for a composite structure comprises a base substrate including an epitaxial layer of silicon on a monocrystalline silicon wafer obtained by Czochralski pulling, a passivation layer on and in contact with the epitaxial layer of silicon, and a charge-trapping layer on and in contact with the passivation layer. The monocrystalline silicon wafer of the base substrate exhibits a resistivity of between 10 and 500 ohm·cm, while the epitaxial layer of silicon exhibits a resistivity of greater than 2000 ohm·cm and a thickness ranging from 2 to 100 microns. The passivation layer is amorphous or polycrystalline. A method is described for forming such a substrate.

Method for forming a handling substrate for a composite structure intended for RF applications and handling substrate

A semiconductor structure for radio frequency applications includes a support substrate made of silicon and comprising a mesoporous layer, a dielectric layer arranged on the mesoporous layer and a superficial layer arranged on the dielectric layer. The mesoporous layer comprises hollow pores, the internal walls of which are mainly lined with oxide. The mesoporous layer has a thickness between 3 and 40 microns and a resistivity greater than 20 kohm·cm over its entire thickness. The support substrate has a resistivity between 0.5 and 4 ohm·cm. The invention also relates to a method for producing such a semiconductor structure.

Semiconductor structure comprising a buried porous layer for RF applications

A hybrid structure for a surface acoustic wave device comprises a working layer of piezoelectric material assembled with a support substrate having a lower coefficient of thermal expansion than that of the working layer, and an intermediate layer located between the working layer and the support substrate. The intermediate layer is a sintered composite layer formed from powders of at least a first material and a second material different from the first.

Hybrid structure for surface acoustic wave device and associated production method

A substrate for radiofrequency microelectronic devices comprises a carrier substrate made of a semi-conductor, a sintered composite layer disposed on the carrier substrate and formed from powders of at least a first dielectric material and a second dielectric different from the first material, the sintered composite layer having a thickness larger than 5 microns and a thermal expansion coefficient that is matched with that of the carrier substrate to plus or minus 30%.

Substrate for radiofrequency applications and associated manufacturing method

A support for a semiconductor structure includes a base substrate, a first silicon dioxide insulating layer positioned on the base substrate and having a thickness greater than 20 nm, and a charge trapping layer having a resistivity higher than 1000 ohm&#xb7;cm and a thickness greater than 5 microns positioned on the first insulating layer.

Support for a semiconductor structure

A method for dissolving a buried oxide in a silicon-on-insulator wafer comprises providing a silicon-on-insulator wafer having a silicon layer attached to a carrier substrate via a buried oxide layer, and annealing the silicon-on-insulator wafer to at least partially dissolve the buried oxide layer. The method further comprises a step of providing an oxygen scavenging layer on or over the silicon layer before the annealing step.

Method for dissolving a buried oxide in a silicon-on-insulator wafer

A method for minimizing harmonic distortion and/or intermodulation distortion of a radiofrequency signal propagating in a radiofrequency circuit formed on a semiconductor substrate coated with an electrically insulating layer, wherein a curve representing the distortion as a function of a power of the input or output signal exhibits a trough around a given power (P), the method comprises applying, between the radiofrequency circuit and the semiconductor substrate, an electrical potential difference (V) chosen so as to move the trough toward a given operating power of the radiofrequency circuit.

Method for minimizing distortion of a signal in a radiofrequency circuit

A method for manufacturing a high-resistivity semiconductor-on-insulator substrate comprising the steps of: a) forming a dielectric layer and a semiconductor layer over a high-resistivity substrate, such that the dielectric layer is arranged between the high-resistivity substrate and the semiconductor layer; b) forming a hard mask or resist over the semiconductor layer, wherein the hard mask or resist has at least one opening at a predetermined position; c) forming at least one doped region in the high-resistivity substrate by ion implantation of an impurity element through the at least one opening of the hard mask or resist, the semiconductor layer and the dielectric layer; d) removing the hard mask or resist; and e) forming a radiofrequency (RF) circuit in and/or on the semiconductor layer at least partially overlapping the at least one doped region in the high-resistivity substrate.

Method for manufacturing a high-resistivity semiconductor-on-insulator substrate including an RF circuit overlapping a doped region in the substrate

Methods of fabricating semiconductor structures involve the formation of fins for finFET transistors having different stress/strain states. Fins of one stress/strain state may be employed to form n-type finFETS, while fins of another stress/strain state may be employed to form p-type finFETs. The fins having different stress/strain states may be fabricated from a common layer of semiconductor material. Semiconductor structures and devices are fabricated using such methods.

Method for fabricating a semiconductor device including fin relaxation, and related structures

The present invention relates to a pair of transistors wherein each transistor of said transistor pair is made of several sub-transistors, and each sub-transistor of a transistor has a sub-transistor channel length and has a sub-transistor channel width, said sub-transistor channel length being substantially equal to the transistor channel length, and said sub-transistor channel width being smaller than the transistor channel width, so that the sum of the sub-transistor channel widths of the sub-transistors of a transistor is substantially equal to the channel width of said transistor, wherein each sub-transistor () of a transistor of said transistor pair is spaced apart from at least one adjoining sub-transistor () of the other transistor of said transistor pair by a distance D less than half the transistor channel width, said distance d between two sub-transistors () being measured between the respective center of the channels of said sub-transistors.

Matching of transistors

The invention relates to a method for manufacturing a semiconductor on insulator type substrate for radio frequency applications, comprising the following steps in sequence: (a) provision of a silicon substrate with an electrical resistivity of more than 500 Ohm.cm, (b) formation of a polycrystalline silicon layer on the substrate, the method comprising a step between steps a) and b) to form a dielectric material layer, different from a native oxide layer, on the substrate, between 0.5 and 10 nm thick.

Manufacturing method for a semiconductor on insulator type substrate for radiofrequency applications

The invention relates to a method for fabricating a locally passivated germanium-on-insulator substrate wherein, in order to achieve good electron mobility, nitridized regions are provided at localized positions. Nitridizing is achieved using a plasma treatment. The resulting substrates also form part of the invention.

Locally passivated germanium-on-insulator substrate

The present invention relates to a process for preparing semiconductor-on-insulator type structures that include a semiconductor layer of a donor substrate, an insulator layer and a receiver substrate. The process includes bonding of the donor substrate onto the receiver substrate, with at least one of the substrates being coated with an insulator layer, and forming at the bonding interface a so-called trapping interface of electrically active traps suitable for retaining charge carriers. The invention also relates to a semiconductor-on-insulator type structure that includes such a trapping interface.

Charge reservoir structure

A method and system are provided for manufacturing a base substrate that is used in manufacturing a semi-conductor on insulator type substrate. The base substrate may be manufactured by providing a silicon substrate having an electrical resistivity above 500 Ohm&#xb7;cm; cleaning the silicon substrate so as to remove native oxide and dopants from a surface thereof; forming, on the silicon substrate, a layer of dielectric material; and forming, on the layer of dielectric material, a layer of poly-crystalline silicon. These actions are implemented successively in an enclosure.

Method of manufacturing a base substrate for a semi-conductor on insulator type substrate

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Grenoble, France

Frédéric Allibert