Infineon Technologies Ag

Siemens Aktiengesellschaft

Hewlett-packard Corporation

Franz Stegerer

Klaus Elian

Michael Weber

Thomas Wagner

Otto Voggenreiter

Peter Wojtalla

Johann Breu

Walter Juri

Walter Diez

Hardy Dallabetta

Leon Masseus

Ludwig Pirkl

Mee-Moi Yap

A device is disclosed. In one embodiment the device comprises a bias field generator configured to provide a magnetic bias field for a magnetic sensor, the bias field generator including a body comprising magnetic or magnetizable material, a packaged magnetic sensor accommodating the magnetic sensor and a recess disposed in the body, wherein the packaged magnetic sensor is arranged in the recess, and wherein the body includes two separate body parts, each body part include a part of the recess, and each body part is configured to hold in place the packaged magnetic sensor.

Bias field generator including a body having two body parts and holding a packaged magnetic sensor

A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device that conveys electronic components to the first and second testers in a synchronized manner such that the external contacts of the electronic components form an electrical connection to the testing contacts. Via the testing contacts, it is possible to apply input voltages and input currents to the electronic components and it is possible to measure the voltages, currents and resistances prevailing in the electronic components. The testers check the electronic components on the basis of a predetermined overall set of test criteria or on the basis of subsets of the overall set of test criteria.

Device and method for testing electronic components

A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, testing the same parameter of the product with a second testing device using a second input signal that is independent of the first input signal to produce a second test result. Third, deriving a differential value from the test results obtained by the testing devices. Fourth, determining the conformance of the testing station from the differential value and outputting an error message when the differential value deviates from a predetermined range. Fifth, repeating above steps for at least one other parameter.

Test procedure and test station for carrying out the test procedure

Growing community of inventors

Wuppertal, Germany

Franz Stegerer