Adv Antest Corporation

Franz Rottner

Martin Fischer

Rudi Bauer

Alois Thalmaier

Martin Vital

A power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is triggered in response to an expected load change. An Automated test equipment for testing a device under test comprises a power supply, which is configured to supply the device under test. The automated test equipment comprises a pattern generator configured to provide one or more stimulus signals for the device under test. The power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation mechanism which is activated in synchronism with one or more of the stimulus signals and/or in response to one or more response data signals from the device under test. Corresponding methods and a computer program are also described.

Power supply, automated test equipment, method for operating a power supply, method for operating an automated test equipment and computer program using a voltage variation

An electronic circuit for switching purposes comprises a set of at least four electronic switches. A first subset and a second subset comprise at least two electronic switches of said set, respectively. Said at least two electronic switches of said first subset are arranged in a serial connection. Said at least two electronic switches of said second subset are arranged in a serial connection. The electronic circuit comprises a first buffer connected to a first electronic switch of said first subset and a second buffer connected to a second electronic switch of said second subset. Said first buffer minimises a potential drop across said first electronic switch when in open state, and said second buffer minimises a potential drop across said second electronic switch when in open state. The electronic circuit further comprises a switched connection towards ground arranged in between the two subsets.

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Wasserburg, Germany

Franz Rottner