Infineon Technologies Ag

Franz Reinwald

Gerhard Zojer

Stefan Zerlauth

A semiconductor and method is disclosed. One embodiment includes a detector arrangement to detect the position of a connection element. A probe tip, the detector arrangement including first connection pads are arranged on a substrate surface. A first circuit is connected to the first connection pads.

Method and device for position detection using connection pads

A device for testing a pressure sensor having a pressure-sensitive region includes a fixture for a pressure sensor designed to receive the pressure sensor, a nozzle designed to generate a gas flow interacting with the pressure-sensitive region of the pressure sensor and positioned so close to the fixture such that the nozzle does not contact the pressure-sensitive region of the pressure sensor and a predefined portion of the pressure-sensitive region experiences an increased or decreased pressure relative to ambient pressure which is constant within a deviation of 10% relative to a pressure mean value, and a measurer designed to measure an electrical signal received by the pressure sensor.

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Wernberg, Austria

Franz Reinwald