Emc Corporation

Frank Rienzo

Scot C Tata

Ronald Noret

The invention is directed to techniques for dampening vibration of a disk drive using a dampening member which is co-planar with a mid-plane of the disk drive, and which has at least a portion extending from a carrier toward a main assembly when the carrier is installed within the main assembly in order to dampen vibration of the disk drive when the disk drive is in operation. The use of the dampening member in this location results in vibration dampening which is superior to conventional disk drive mechanisms. In particular, since the dampening member is co-planar with the mid-plane of the disk drive, the dampening member dampens vibration along a critical direction providing substantial vibration isolation. Accordingly, disk drives configured in accordance with the invention are capable of providing high performance even in high rotation speed (i.e., high RPM) and high density configurations.

Methods and apparatus for dampening vibration of a disk drive

The invention is directed to techniques for obtaining a connection characteristic (e.g., pin wipe) of a connection assembly having a first set of contacts (e.g., pin-receiving contacts of circuit board connectors) and a second set of contacts (e.g., pins of backplane connectors) using less destructive approaches than a conventional disassembly approach. In particular, the invention does not rely on disassembling a backplane from a card cage and cutting connectors. Rather, in one arrangement, the invention uses a test structure in place of a normal operating circuit board. The test structure includes a support member (e.g., circuit board material) that supports the first set of contacts, and that is capable of moving relative to the second set of contacts. The test structure further includes a detection circuit, coupled to the support member, that detects an electrical event resulting from movement of the first set of contacts relative to the second set of contacts (e.g., making electrical contact between the first and second sets of contacts). The test structure also includes a measuring device, coupled to the support member, that identifies position coordinates resulting from movement of the first set of contacts relative to the second set of contacts. The measuring device enables a user to identify (i) a first position coordinate in response to the electrical event resulting from movement of the first set of contacts relative to the second set of contacts, and (ii) a second position coordinate in response to a mechanical event resulting from movement of the first set of contacts relative to the second set of contacts (e.g., the first set of contacts reaching a fully seated position relative to the second set of contacts). A difference between the first and second position coordinates provides the connection characteristic of the connection assembly. Preferably, the test structure is reusable and portable, and can be used to measure connection characteristics of products in a manufacturing assembly line, or out in the field (e.g., at customer sites).

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Mendon, MA, United States of America

Frank Rienzo