Agfa Corporation

Agfa Division, Bayer Corporation

Gerenraich Family Trust

Bayer Corporation -- Agfa Division

Frank Lynn Scholten

Roy D Allen

David B Larsen

Norman F Rolfe

Laurence S Blake

Henry A Kelley

Kenneth B Gerenraich

Ralph Giffone

David Wadlow

A capacitive sensor system for controlling operation of a device in response to a rate of change in capacitance due to motion of a proximate object includes at least two sense electrodes disposed on a surface and a phase locked loop, including a voltage controlled oscillator and a phase/frequency comparator, connected between the sense electrodes and an RC network for providing an operating frequency to the sense electrodes. A circuit loop, including a reference oscillator, provides a fixed frequency reference for the phase locked loop to follow and a phase delay circuit connected between the phase/frequency comparator and the voltage controlled oscillator causes the voltage controlled oscillator to run ahead of the reference oscillator. A trigger circuit provides a control output in response to a change in phase shift between the fixed frequency and the operating frequency.

Control system with capacitive detector

A capacitive sensor system for controlling operation of a device in response to a rate of change in capacitance due to motion of a proximate object includes at least two sense electrodes disposed on a surface and a phase locked loop, including a voltage controlled oscillator and a phase/frequency comparator, connected between the sense electrodes and an RC network for providing an operating frequency to the sense electrodes. A circuit loop, including a reference oscillator, provides a fixed frequency reference for the phase locked loop to follow and a phase delay circuit connected between said phase/frequency comparator and said voltage controlled oscillator causes the voltage controlled oscillation to run ahead of the reference oscillator. A trigger circuit provides a control output in response to a change in phase shift between said fixed frequency and said operating frequency.

A method and apparatus are provided for canceling crosstalk noise arising on signal lines output from an image sensor. More specifically, the crosstalk noise is canceled by a current mirror that is coupled to the signal line. The current mirror adjusts the voltage level on the signal line by drawing a current therefrom that is proportional to the amount and polarity of the crosstalk noise. The amount of crosstalk noise is determined by an amount of coupling within an A/D converter coupled to the signal lines. The current mirrors can further adjust the voltage on the signal line by drawing a current therefrom that is proportional to crosstalk arising due to a voltage level on another signal line. Such a current mirror allows pixel data to be conveyed to the A/D converter, via the signal lines, without imparting aberrations due to crosstalk noise.

Crosstalk cancellation in a multi-color CCD signal processor

A correction element assembly for correcting misalignment of a beam of radiation with respect to a location on a target includes a correction element housing, and first and second piezo elements. The correction element is fixedly mounted in the housing and moveable therewith. The piezo elements are supported by a member having a first portion and a second portion. The first piezo element is mounted to the first portion of the member and to said housing, and moves the housing in a first direction. The second piezo element is mounted to the second portion of the member and to a base, and moves the housing in a second direction substantially perpendicular to the first direction.

Beam alignment correction element assembly

A beam scanning system for scanning an imaging surface includes a phase shifter for issuing phase signals, a radiation emitter for emitting a beam of radiation and a deflection element, such as an acousto-optic modulator or translating lens, for deflecting the radiation beam. Depending on the implementation, the emitter can be configured to phase shift the radiation beam and/or the deflection element can be configured to deflect the radiation beam in accordance with the issued phase signals. By emitting and/or deflecting the radiation beam in accordance with the phase signals, the length of the scan line formed on the imaging surface can be controlled. A deflector, such as a spin mirror or rotatable prism, is provided to direct the radiation beam to form a scan line on the imaging surface.

Optical scanning with phase shifted beam

A multi-beam scanning system for scanning a curved imaging surface includes at least one radiation emitter which emits first and second beams of radiation. A spin deflector, rotatable about a spin axis, directs the first beam to form a first scan line and the second beam to form a second scan line on the imaging surface. A deflection element, disposed in the path of the first beam and upstream of the spin deflector, operates to deflect the first beam with respect to the rotation of the spin deflector. The spin deflector is impinged by beams of radiation only at a distance, other than zero, from the spin axis.

Scanner with deflection element for scanning imaging surfaces

A correction element assembly for correcting misalignment of a beam of radiation with respect to a location on a target, includes a housing having a correction element fixedly mounted therein. A flexure is attached to the housing and at least two drive devices are disposed radially around the housing. Each of the drive devices is operable to apply a force to the housing to thereby deflect the flexure causing the housing to move such that said correction element moves in a cyclic fashion about its beam axis.

A scanning system for scanning an imaging surface includes a radiation emitter configured to emit a beam of radiation directed towards a deflector for scanning the beam onto the imaging surface. A detector detects any misalignment of the beam with respect to the deflector. A driver moves a correction element substantially perpendicular to the beam axis of the correction element to correct for the detected misalignment during scanning of the imaging surface.

Beam error correction using movable correction element

A multibeam scanning system for scanning an imaging surface, includes at least one radiation emitter configured to emit a first beam of radiation and a second beam of radiation. A spin deflector, rotatable about a spin axis, is provided to direct the first beam to form a first scan line and the second beam to form a second scan line on the imaging surface. At least one moving element, such as a translating lens, disposed upstream of said spin deflector, operates to deflect at least one of the beams with respect to the spin axis of the spin deflector.

Multi-beam scanner with mechanically moving element for scanning imaging

A multi-beam scanning system for scanning a curved imaging surface includes at least one radiation emitter configured to emit a first beam of radiation and a second beam of radiation. A spin deflector, rotatable about a spin axis, directs the first beam to form a first scan line and the second beam to form a second scan line on the imaging surface. At least one acousto-optic element, disposed in the path of at least one of the beams and upstream of the spin deflector, is operable to deflect the at least one beam with respect to the spin axis of the spin deflector.

Growing community of inventors

Livingston, NJ, United States of America

Frank Lynn Scholten