Carl Zeiss Ag

Carl Zeiss Industrielle Messtechnik Gmbh

Frank Hoeller

Bernd Spruck

Cristina Alvarez Diez

Marc Tremont

Oliver Schmidt

Enrico Geissler

Friedrich-Wilhelm Schumacher

Stefan Richter

Frank Widulle

Lars-Christian Wittig

Christian Koos

Simon Brattke

Christoph-Hilmar Graf Vom Hagen

Oliver Paul

Christian Hembd

A device for measuring objects is provided, said device comprising a mobile base such that it is movable to objects to be measured. Then, the object may be measured by means of a measuring head fastened to a kinematic unit.

Device for measuring objects

A method for calibrating an optical arrangement for determining dimensional properties of a measurement object and a coordinate measuring machine implementing the method are disclosed. The optical arrangement has a camera and a projector for projecting a first periodic pattern onto a projection area. The optical arrangement is moveable relative to a workpiece table along a first axis. A matte surface is arranged on the workpiece table at a first position relative to the optical arrangement. A second periodic pattern, which is separate from the first periodic pattern, is provided and shifted on the matte surface. Images of the second pattern are recorded using the camera and at least one distortion aberration of the camera is determined using the second periodic pattern. The first periodic pattern is projected onto the matte surface and first and second coordinates of at least one pattern point of the projected first periodic pattern are determined, the second coordinate with respect to a second axis, which is perpendicular to the first axis. The matte surface is displaced relative to the optical arrangement to a second position along the first axis and the aforementioned steps are repeated for a plurality of relative positions of the matte surface along the first axis.

Method for calibrating an optical arrangement

An optical sensor for determining a coordinate of a measurement object is provided which includes a stop element and an illumination apparatus configured to generate an illumination light beam and to illuminate the measurement object through the stop element, a sensor element configured to detect a portion of a detection light beam emanating from the measurement object and to determine an intensity distribution, and an optical element configured to focus a portion of the illumination light beam at one focal point along an optical axis. The optical sensor includes an apparatus configured to vary and set a relative lateral position of the optical axis to the measurement object to determine, for each of first and second focal points, first and second intensity distributions at first and second relative lateral positions and to determine therefrom a distance coordinate and/or a lateral coordinate of the measurement object.

Method and optical sensor for determining at least one coordinate of at least one measurement object

The invention is directed to a method for measuring an internal thread of a workpiece with a coordinate measuring apparatus and a CCD or CMOS sensor. The sensor records at least two images of a section of the internal thread and the recording conditions for the two images are modified. The data from these two recorded images are used to establish the position, orientation, core diameter and/or the pitch of the internal thread. The invention is also directed to an arrangement for measuring an internal thread of a workpiece and includes a coordinate measuring apparatus and the CCD or CMOS sensor in accordance with the above method.

Method and arrangement for measuring internal threads of a workpiece with an optical sensor

A device for determining a position of an object () in a spatial region () comprises a light source (), a light directing device (-), at least one reference signal detector () and a detector arrangement (). The light source () generates a sequence of light pulses with a repetition rate. The light directing device (-) directs the sequence of light pulses into the spatial region () and, as a reference signal (), to the at least one reference signal detector (). The detector arrangement () detects a plurality of light signals () which are reflected and/or scattered by the object () in the spatial region () into a plurality of different directions by reflection and/or scattering of the sequence of light pulses. The evaluation circuit () is coupled to the detector arrangement () and the at least one reference signal detector () and determines a phase difference () between the reference signal () and a signal component of at least one light signal (). The phase difference is determined based on the signal component which has a frequency that corresponds to a multiple of the repetition rate.

Method and device for determining a position of an object

A device for measuring a surface () comprises a light source (), a light directing device (-), a detector arrangement () and an evaluation circuit (). The light source () generates a sequence of light pulses with a repetition rate. The light directing device (-) is controllable to direct the sequence of light pulses onto a surface area () of the surface (). The surface area may be selected from plural surface areas (). The detector arrangement is configured to receive at least one light signal (-) scattered and/or reflected by the surface area (). The evaluation circuit () is coupled to the detector arrangement () and is configured to determine a phase difference between a reference signal () derived from the sequence of light pulses and a signal component of the at least one light signal (-), in order to determine a position of the surface area (). In doing so, the phase difference is determined for the signal component which has a frequency corresponding to a multiple of the repetition rate.

Device and method for measuring a surface

An evaluation device for path length measurement configured to evaluate a measured signal representing an intensity of a sequence of pulses of electromagnetic radiation, particularly a sequence of light pulses, as a function of time, after the sequence has traveled through a path length to be measured. The sequence of light pulses is generated with a repetition rate by a radiation source, particularly a light source. The evaluation device is configured to evaluate a first component of the measured signal, which oscillates with a first frequency, and a second component of the measured signal, which the second component oscillates with a second frequency that is greater than the first frequency. The first frequency may correspond to the repetition rate or a multiple of the repetition rate. The second frequency may correspond to another multiple of the repetition rate.

Evaluation device, measuring arrangement and method for path length measurement and measuring system and method for a coordinate measuring device and coordinate measuring device

An evaluation device, measuring arrangement and method for path length measurement. The evaluation device for path length measurement is configured to evaluate a measured signal which represents an intensity of a sequence of pulses of electromagnetic radiation as a function of time. The sequence of pulses has a repetition rate. The evaluation device is configured to determine a phase difference between a component of the measured signal, the component oscillating with a frequency, and a reference signal which oscillates with the frequency. For this purpose, the evaluation device generates, for example by frequency mixing, a first signal and a second signal which have another phase difference, such that the first signal and the second signal each oscillates with another frequency which is different from said frequency, and that the other phase difference has a predetermined relation to the phase difference.

Evaluation device, measuring arrangement and method for path length measurement

In an embodiment a method for position determination of an object in a spatial area is provided in which the object is illuminated with at least one light beam. The light beam does not cover the complete spatial area and is guided into a part of the spatial area in which the object is present depending on the position of the object. In another aspect a method for measuring a surface is provided.

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Aalen, Germany

Frank Hoeller