Incoatec Gmbh

Frank Hertlein

Andreas Kleine

Josef Kreith

An X-ray analysis apparatus has at least one X-ray aperture () which delimits an X-ray beam (RS) emitted by an X-ray source (). The at least one X-ray aperture () is disposed at a separation from the sample () and has a single crystal aperture body () with a through pinhole (). The single crystal aperture body () forms a peripheral continuous edge () which delimits the X-ray beam (RS) and starting from which the pinhole () widens like a funnel in a direction of an outlet opening () of the X-ray aperture () in a first area (B). The X-ray analysis apparatus reduces impairment of X-ray measurements due to parasitic scattered radiation and at little expense.

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Luebeck, Germany

Frank Hertlein