Rohde and Schwarz Gmbh & Co. Kg

Frank Gumbmann

Sherif Sayed Ahmed

Tobias Koeppel

Benedikt Simper

Steffen Neidhardt

Christian Evers

Gerhard Hamberger

Matthias Beer

Andreas Schiessl

Michael Freissl

Thomas Fischer

Maximilian Bogner

Ralf Juenemann

Athanasios Karamalis

Andreas Genghammer

Andreas Vonloesecke

Tobias Köppel

An imaging system for material characterization of a sample is provided. Said imaging system comprises at least two imaging arrays configured to form at least one imaging array pair. In this context, the imaging system is configured to perform at least one reflection measurement with the aid of at least one imaging array. Furthermore, the imaging system is configured to perform at least one transmission measurement with the aid of the at least one imaging array pair. In addition to this, the imaging system is configured to determine material characteristics of the sample on the basis of the at least one reflection measurement and/or the at least one transmission measurement.

Imaging system and method for material characterization of a sample

A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Measurement setup, reference reflector as well as method for measuring attenuation

An RCS reduction surface for reducing a radar cross section of an object is described. The RCS reduction surface comprises at least one absorber portion, wherein the absorber portion is configured to absorb radar waves. The RCS reduction surface further comprises at least one reflecting portion, wherein the reflecting portion is configured to reflect radar waves. A first plane being associated with a top surface of the absorber portion and a second plane being associated with a top surface of the reflecting portion are spaced from each other by a predefined distance. The predefined distance is configured such that radar waves with a predefined wavelength range that are reflected at the absorber portion and at the surface of the reflecting portion interfere destructively with each other. Further, an RCS reduction member and a radar test system are described.

RCS reduction surface, RCS reduction member, and radar test system

A multiple input multiple output imaging array for incident angle resolved images with respect to a device under test is provided. The multiple input multiple output imaging array comprises a redundant array of transmit and receive antennas and a controller. In this context, the controller is configured to implement a selection scheme, wherein the selection scheme selects the respective transmit and receive antenna pairs used to create the corresponding image.

Multiple input multiple output imaging array and corresponding imaging method

A method for determining the three-dimensional alignment of components of a radar system is described. The radar system is provided that comprises at least one portion which is permeable by radar signals. The radar system is imaged by using millimeter waves emitted by an imaging system. In the image obtained, it is determined the highest magnitude reflection coinciding with at least one of an expected location and an expected distance of the surface of a first component of the radar system being of interest. At least one of the position and the distance of that surface is determined. From the measurement, the relative phase information received from each portion of that surface at the determined position and/or the determined distance is obtained. Processing the phase information obtained so as to obtain the azimuth and tilt of the surface. Further, a testing system is described.

Method as well as system for determining the three-dimensional alignment of components of a radar system

A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup comprises a positioning system, a reference reflector having a collection of diffuse scattering members, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

A method for determining a permittivity of a substance layer is provided. The method comprises the steps of depositing a layer of a certain thickness of the substance on a substrate comprising at least one substrate parameter of electromagnetic relevance in order to form a sample arrangement, obtaining at least one measurement parameter of electromagnetic relevance with respect to the surface of the sample arrangement with the aid of an electromagnetic excitation signal generated by a measurement equipment, and determining the permittivity of the substance layer on the basis of the at least one measurement parameter of electromagnetic relevance.

Method and system for determining a permittivity of a substance layer

A method for determining optimum parameters with respect to transmission and/or reflection of a surface is provided. The method comprises the steps of applying the surface to a transformer material in order to form a sample arrangement, and obtaining at least one measurement parameter of electromagnetic relevance with respect to the surface of the sample arrangement with the aid of an electromagnetic excitation signal generated by a measurement equipment. In this context, the transformer material comprises at least two dimensions for varying a contribution of at least one sample parameter of electromagnetic relevance over the surface.

Method and system for determining optimum parameters with respect to electromagnetic behavior of a surface

A system for scanning a form of interest, while the form of interest is in motion, is provided. The system comprises a first detector panel-pair, comprising a first detector panel and a second detector panel, spatially offset from the first detector panel by a first continuous passageway for the motion of the form of interest. A second detector panel-pair comprises a third detector panel and a fourth detector panel, spatially offset from the third detector panel by a second continuous passageway for the motion of the form of interest, and a location-tracking device adapted to monitor the location of the form of interest.

Security scanning system with walk-through-gate

A calibration device for calibrating an antenna array is provided. The calibration device comprises a transmitter, which is configured for transmitting a first calibration signal to all antennas of the antenna array, resulting in a plurality of received first calibration signals provided by the antenna array to the calibration device. Moreover, the calibration device comprises a receiver, which is configured for receiving a plurality of second calibration signals from the antennas of the antenna array. Finally, the calibration device comprises an antenna characteristic calculator, which is configured for calculating an antenna characteristic of each individual antenna of the antenna array based on the plurality of received first calibration signals and the plurality of received second calibration signals.

Calibration device and calibration method for calibrating antenna arrays

The invention relates to a system for the illumination and imaging of objects with the assistance of electromagnetic radiation, for example, millimeter radiation. Such a system comprises at least one transmitting antenna, at least one receiving antenna, and at least one reflector element. An actively polarizing material layer is present on the reflector element. A processing unit determines an image of the object on the basis of the radiation received from the receiving antenna.

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Nuremberg, Germany

Frank Gumbmann