Leica Microsystems Jena Gmbh

Frank Bernhardt

Andreas Birkner

Knut Hiltawski

Dominik Grau

The invention relates to an arrangement for transporting and inspecting semiconductor substrates (), having at least three workstations (), a changer (), which has at least three arms () which are designed to load the individual workstations () with semiconductor substrates (). A measuring device () is assigned to the second workstation (), determines the deviation of the current position of the semiconductor substrate () and makes it available to the arrangement () for the further inspection of the semiconductor substrate (). In addition, the changer () is not equipped with means for exact positioning of the semiconductor substrates () in the workstations ().

Method and arrangement for transporting and inspecting semiconductor substrates

An arrangement for the identification of a substrate (S) having at least one identification marking (I), comprising A corresponding identification method is also described.

Arrangement and method for the identification of substrates

The invention relates to an arrangement for transporting and inspecting semiconductor substrates ( ), having at least three workstations ( ), a changer ( ), which has at least three arms ( ) which are designed to load the individual workstations ( ) with semiconductor substrates ( ). A measuring device ( ) is assigned to the second workstation ( ), determines the deviation of the current position of the semiconductor substrate ( ) and makes it available to the arrangement ( ) for the further inspection of the semiconductor substrate ( ). In addition, the changer ( ) is not equipped with means for exact positioning of the semiconductor substrates ( ) in the workstations ( ).

Growing community of inventors

Kahla, Germany

Frank Bernhardt