International Business Machines Corporation

Ebay, Incorporated

Cadence Design Systems, Inc.

Franco Motika

Edward Emile Kelley

Mary Prilotski Kusko

Wayne Michael Delia

Gerard M Salem

Peilin Song

William Vincent Huott

Phong T Tran

John D Parker

Gary William Maier

Phil Nigh

Paul Victor Motika

Phillip J Nigh

Richard Frank Rizzolo

Leendert M Huisman

Eric Michael Motika

Paul Steven Zuchowski

Norman J Dauerer

Anne Elizabeth Gattiker

Donato Orazio Forlenza

Marc Douglas Knox

Eugene R Atwood

Timothy J Koprowski

Jody John Van Horn

Maroun Kassab

David A Grosch

Ulrich Baur

John A Waicukauski

Tijs Y Wilbrink

Preetham M Lobo

Edward B Eichelberger

Mitesh A Agrawal

Gobinda Das

Leah M Pfeifer Pastel

John James Shushereba

Eric Lindbloom

Dirk Pfeiffer

Tobias Webel

Orazio Pasquale Forlenza

Todd Michael Burdine

Kim H Ruffing

Rao H Desineni

Leah Marie Pfeifer Pastel

Paul Jacob Logsdon

John L Sinchak

Roger N Langmaid

Raymond J Kurtulik

Michael Richard Ouellette

Steven Michael Douskey

Franco Stellari

Andrew A Turner

Pradip Patel

Daniel Rodko

Bryan J Robbins

Paul M Gaschke

Tijs I Wilbrink

Aziz M Ahsan

David F Heidel

Joseph E Eckelman

Joseph B Frei

Kevin William McCauley

Thomas G Foote

Howard B Druckerman

Charles J Blasi

Steven Michnowski

James Bernard Webb

Stephen V Pateras

Peitin Song

Adrian Charles Anderson

Jay H Anderson

Samuel A Foster

Robert M Casatuta

Philip J Nigh

Rocco E DeStefano

Data privacy for data associated with traveling in a vehicle that has access to passenger data, vehicle location data, vehicle navigation data, peripheral data; and/or itinerary data. Privacy is achieved by data classification and corresponding data security preferences and/or user selection including end of trip data disposition actions.

User privacy for autonomous vehicles

A method includes executing a test against a first structure and a second structure of a built-in self-test circuit. Each of the first and second structures include a plurality of latches arranged as a plurality of stump chains. The method also includes unloading a first result of the test from the plurality of stump chains of the first structure and a second result of the test from the plurality of stump chains of the second structure. The method further includes determining that the plurality of stump chains of the first structure includes a faulty latch based on the first result not matching the second result.

Diagnostic enhancement for multiple instances of identical structures

A near field communication device included in a secure transaction card provides an addition and/or transitional communication link for communicating secure transaction information. The near field communication device may be selectively engaged or disengaged and, when engaged, either active or passive modes of operation of the near field communication device can be selected. in the active mode, secure transaction information is transmitted upon establishment of a communication link with a complementary near field communication device. In the passive mode, secure transaction information is transmitted upon interrogation from a complementary near field communication device. Secure transaction information is generated and stored for transmission in a memory and at least a portion of the memory is erased or nulled upon transmission or upon expiration of a selected period of time.

Secure credit card with near field communications

A series of pseudo-random test patterns provide inputs to a logic circuit for performing logic built-in self test (LBIST). A weight configuration module applies one or more weight sets to the pseudo-random test patterns, to generate a series of weighted pseudo-random test patterns. A logic analyzer determines a probability expression for each given net of the logic circuit, based on associated weight sets and a logic function performed by the net. A probability module computes an output probability for each net based on associated probability expressions and associated input probabilities. The weight configuration module optimizes the weight sets, based on the computed net probabilities, and further based on a target probability range bounded by lower and upper cutoff probabilities.

Dynamic weight selection process for logic built-in self test

Examples described herein provide a computer-implemented method that includes initiating a logic built-in self-test (LBIST) of a device under test (DUT). The method further includes performing latch state counting using a multiple input signature register (MISR) of the DUT, the performing responsive to the MISR being in a counter mode. The method further includes performing a latch transition counting of latches of the DUT using the MISR of the DUT and a storage latch, the performing responsive to the MISR being in the counter mode. The method further includes performing a latch count comparison by comparing an output of the MISR responsive to the MISR being in the counter mode to an output of a count compare register, the output of the count compare register representing a desired MISR state.

Empirical LBIST latch switching and state probability determination

An approach for testing, including a self-test method, a semiconductor chip is disclosed. The approach generates test patterns, including weighted random test patterns, for testing random pattern resistant faults, and un-modeled faults directed at specific logic groups, where the dynamically generated test pattern weights are configured to optimize test coverage and test time. The dynamically generated test patterns are based on factors related to random pattern resistant logic structures interconnected via scan chains. More particularly, the dynamically generated test patterns are designed to enable fault detection within logic structures that are resistant to fault detection when tested with random patterns.

Logic built-in self test dynamic weight selection method

Methods, systems and computer program products for loading, storing and executing dynamically modifiable functional exercisers are provided. Aspects also include receiving a plurality of functional exercisers by a secondary reload memory disposed on a device-under-test. Aspects include loading at least a first functional exerciser from the secondary reload memory into a primary execution memory disposed on the device-under-test. Aspects include executing and modifying the first functional exerciser stored in the primary execution memory. Aspects further include, responsive to determining based on a test algorithm that one or more functional exercisers of the plurality have not been fully executed, loading a second functional exerciser from the secondary reload memory into the primary execution memory.

Iterative functional test exerciser reload and execution

Embodiments are directed to a computer implemented method and system for the testing, characterization and diagnostics of integrated circuits. A system might include a device under test, such as an integrated circuit, that includes an adaptive microcontroller. The method includes loading a testing program for execution by the adaptive microcontroller, causing the microcontroller to execute the testing program. Once results from the testing program are received, the testing program can be adaptively modified based on the results. The modified testing program can be run again. The testing program can modify parameters of the integrated circuit that are not externally accessible. Other embodiments are also disclosed.

Built-in device testing of integrated circuits

Providing non-destructive recirculation test support in a device under test includes determining an initial latch allocation of a plurality of latches to form a plurality of self-test chains for the device under test. An optimized latch allocation to the self-test chains is determined based on a plurality of physical and logical grouping constraints. One or more of the latches are adjusted and reassigned between one or more of the self-test chains based on the optimized latch allocation. A recirculating feedback is coupled from an output of at least one of the self-test chains to a recirculation selector. A test input source is coupled to the recirculation selector, where the recirculation selector is operable to select between providing the test input source or the recirculating feedback to an input of the at least one of the self-test chains.

Non-destructive recirculation test support for integrated circuits

Embodiments include methods, and computer system, and computer program products for performing test and calibration of integrated sensors on a processor chip. Aspects include: initializing, by a tester program, an on-chip service engine of processor chip, performing and completing, by on-chip service engine, test and calibration of integrated sensors. The method may also include: loading and decoding tester program into an on-chip service engine memory, testing and calibrating each integrated sensor, which may include: selecting an integrated sensor for test and calibration, loading sensor test and calibration patterns and parameters, and sensor test code, and executing the sensor test code to test and calibrate integrated sensors, writing results of the test and calibration to a predetermined location of the on-chip service engine memory, and writing a return code of test and calibration to another predetermined location of on-chip service engine memory, when every integrated sensor is tested and calibrated.

Methods and systems for performing test and calibration of integrated sensors

An embodiment of the present invention provides a computer-implemented method for functional test and diagnostics of integrated circuits. The computer-implemented method includes executing one or more functional test exercisers in a functional execution sequence for a device under test up to one or more checkpoints, applying dynamic clock switching to a clock of the device under test to identify one or more likely causes of a failure identified at the one or more checkpoints, and includes iteratively invoking a portion of the functional execution sequence between a plurality of the checkpoints to progressively isolate the one or more likely causes of the failure as a most likely failure source based at least in part on the applied dynamic clock switching.

Functional diagnostics based on dynamic selection of alternate clocking

Embodiments include methods, and computer system, and computer program products for performing system functional test on a chip having partial-good portions. Aspects include: initializing, by system functional test software, a service engine of the chip, performing, by service engine, system functional test, and completing system functional test of chip. The chip may include service engine, a service engine memory and one or more 'partial-good' portions. The initializing may include: loading system functional test software into the service engine memory, identifying each 'partial-good' portion of the chip, writing a &#x201c;partial-good&#x201d; parameter for each &#x201c;partial-good&#x201d; portion of the chip identified to service engine memory, and triggering execution of system functional test. Method may include: decoding system functional test software, retrieving &#x201c;partial-good&#x201d; parameters, initializing &#x201c;partial-good&#x201d; portions of chip, and performing system functional test on &#x201c;partial-good&#x201d; portions of chip. The chip may include is a processor chip that has one or more &#x201c;partial-good&#x201d; cores.

Performing system functional test on a chip having partial-good portions

Techniques relate to an interactive logic diagnostic process. A diagnostic iteration loop is performed. When a critical failure does not have the diagnostic resolution that meets a predefined diagnostic resolution, potential faults related to the critical failure are isolated. When the critical failure has a diagnostic resolution that meets the predefined diagnostic resolution, the diagnostic iteration loop ends. Path focused fault test patterns are applied to the device under test in order to generate updated results of the path focused fault test patterns, such that the diagnostic resolution has been increased because a number of the potential faults related to the critical failure has decreased, and/or a size of a physical area of the potential faults related to the critical failure has decreased. The diagnostic iteration loop is returned to.

Iterative N-detect based logic diagnostic technique

Growing community of inventors

Hopewell Junction, NY, United States of America

Franco Motika