Avo Multi-Amp Corporation

Avo Multi-Amp Corporation Dba Megger

Francisco J Pataro

Marvin G Miller

Aaron C Klijn

Michael C Edwards

Terry L Elzy

Eugenio Jorge Tacconi

Bela Deak

Michael Gordon

Michael D Willett

Mahmoud Harmouch

John Leonard Shanks

Michael David Maahs

Stanley I Thompson

A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.

Relay testing system and method

Programmable system for device testing and control

A test device for testing relays is provided. The test device includes a chassis and a plurality of generator components removably coupled to the chassis. Each of the plurality of generator components have a signal generator, a CPU to promote test signal generation by the signal generator, and an amplifier to amplify signals generated by the signal generator. The test device also includes a controller coupled to communicate with the plurality of generator components.

Protective relay test device

Growing community of inventors

Dallas, TX, United States of America

Francisco J Pataro