Commissariat a L'energie Atomique

Francis Joffre

Bernard David

Alain Giraud

Francois Champonnois

Charles Grenouilloux

A method and device for managing the functioning under irradiation of an electronic component having a nominal supply voltage. During a test phase there is applied to the component an initial supply voltage less than the nominal voltage and the functioning of the component is checked. Next, during a working phase, the nominal supply voltage is applied to the component, and finally, during an off-load phase, an off-load voltage is applied to the component in order to determine whether the electronic component functions under irradiation.

Method and device for managing an electronic component with complementary MOS transistors functioning under radiation

The present invention relates to a process for the production of a random access memory of the preloading static type, in which use is made of a static random access memory constituted by MOS transistors formed from the memory flip-flop array and in which a particle or photon beam is applied to the said MOS transistors in such a way that the accumulated dose received exceeds a predetermined value.

Process for the production of random access memories of the preloading

A process for extending the operating period of a circuit having MOS components exposed to gamma radiation wherein identical systems (10a, 10b, 10c) forming the circuit are switched on in turn. Exposure to radiation causes the MOS components to deteriorate. However, when one of the systems are 'on', the others are 'off' and are able to partly or fully recover their original characteristics. The systems are operated for a period of time shorter than that required for deterioration. Specific application to intervention robotics on nuclear sites and space installations.

Process for extending the operating period of a circuit with MOS

A pulsed eddy current testing system for detecting defects in a part. A probe carries an exciting pulse in one coil and receives a measuring signal in a second coil. The measuring signal is sampled at two instants defined by short and long time lags. The two amplitudes obtained are plotted in a representative plane having two reference axes. The point having the signals as coordinates describes a figure eight, when the part has a defect. The size and orientation of the figure gives information on the defect in the part.

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Bures sur Yvette, France

Francis Joffre