Kaiser Optical Systems Inc.

Endress+hauser Optical Analysis, Inc.

Francis Esmonde-White

Joseph B Slater

James M Tedesco

Patrick Wiegand

Darren Schipper

The present disclosure includes discloses a method for analyzing a multi-component gas sample using spectroscopy in combination with the measurement of extrinsic or intrinsic properties of the gas sample. The results of the spectroscopic analysis and the measurement are combined to quantify a gas component unseen by the spectroscopic analysis.

Augmented Raman analysis of a gas mixture

Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

Methods for collection, dark correction, and reporting of spectra from array detector spectrometer

Methods for collection, dark correction, and reporting of spectra from array detector spectrometers

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Ann Arbor, MI, United States of America

Francis Esmonde-White