Ecole De Technologie Superieure

Socovar Sec

Socovar, Societe En Commandite

François Blanchard

Mariia Zhuldybina

Fatemah Amirkhan

Alexandre Robichaud

Frederic Nabki

There is described a terahertz modulation system. The terahertz modulation system generally has a terahertz signal emitter emitting a terahertz signal along a path; a modulation unit having a substrate and an electromechanical transducer actuatably mounted to said substrate, said electromechanical transducer having a terahertz interacting surface in said path receiving said terahertz signal and moving in back-and-forth sequences between first and second positions relative to said path upon actuation with a modulation signal, said moving modulating at least a portion of said terahertz signal; and a terahertz signal detector downstream from said modulation unit along said path, said terahertz signal detector synchronously measuring said modulated portion of said terahertz signal using said modulation signal, and generating a differential signal indicative thereof.

Terahertz modulation system and method of modulating a terahertz signal

There is described a method of assessing an ink deposition accuracy in an electronic device printing process. The method generally has: printing a meta material structure on a substrate using conductive ink, the metamaterial structure having a pattern of conductive elements interspersed with complementary insulating elements, the metamaterial structure having at least a terahertz resonance frequency; emitting a terahertz radiation beam incident on the metamaterial structure of the substrate, the incident terahertz radiation beam having power at least at the terahertz resonance frequency of the metamaterial structure; the metamaterial structure interacting with said incident terahertz radiation beam resulting in an outgoing terahertz radiation beam having a spectral response at least at the terahertz resonance frequency; measuring said spectral response of said outgoing terahertz radiation beam; assessing an ink deposition accuracy of said printing based on said measured spectral response; and generating a signal based on said assessed ink deposition accuracy.

Method of assessing ink deposition accuracy in an electronic device printing process

There is described an electronic device testing system for testing an electronic device having a substrate on which is printed a metamaterial structure using an ink. The electronic device testing system generally has: a terahertz radiation emitter configured to emit an incident terahertz radiation beam to be incident on the metamaterial structure of the substrate, the incident terahertz radiation beam having power at least at the terahertz resonance frequency of the metamaterial structure; a terahertz radiation receiver configured to receive an outgoing terahertz radiation beam outgoing from the metamaterial structure and to measure an amplitude of an electric field of the outgoing terahertz radiation beam at least at the terahertz resonance frequency; and a controller configured to determine a conductivity value indicative of a conductivity of the ink based on said amplitude of the electric field of the outgoing terahertz radiation beam.

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Montréal, Canada

François Blanchard