General Electric Company

Morpho Detection, Inc.

Ge Homeland Protection, Inc.

Forrest Frank Hopkins

Peter Michael Edic

Susanne Madeline Lee

Clifford Bueno

Yanfeng Du

William Robert Ross

Joseph Bendahan

Walter Vincent Dixon, Iii

Gregory Alan Mohr

Samit Kumar Basu

Mark Ernest Vermilyea

Colin Richard Wilson

Clarence Lavere Gordon, Iii

Ricardo Scott Avila

Robert August Kaucic

Thomas William Birdwell

Eberhard Neuser

Robert J Mitchell, Jr

Brian W Lasiuk

Michael Robert Hopple

Ronald Cecil McFarland

Elizabeth Lokenberg Dixon

August David Matula

Kevin Layne Moermond

Geoffrey Harding

Xiaoye Wu

Douglas Albagli

Thomas James Batzinger

Donald E Castleberry

John Scott Price

William Hullinger Huber

James Walter LeBlanc

Francis Howard Little

Joseph Manak

Zhye Yin

Bruno De Man

Deborah Joy Walter

Scott Stephen Zelakiewicz

Vamshi Krishna Reddy Kommareddy

Andrew Joseph Galish

Debasish Mishra

Manoharan Venugopal

William Joseph Kelly

Pierfrancesco Landolfi

Vanita Mani

Rajashekar Venkatachalam

Elizabeth Lockenberg Dixon

William Eugene Powell, Iii

Jong Chul Ye

Paul Francis Fitzgerald

Nityanand Gopalika

Prasad Thapa

Michael Chunhe Gong

Alfried Haase

Eberthard Neuser

An integrated X-ray source is provided. The integrated X-ray source includes a target for emitting X-rays upon being struck by one or more excitation beams, and one or more total internal reflection multilayer optic devices in physical contact with the target to transmit at least a portion of the X rays through total internal reflection to produce X-ray beams, wherein the optic device comprises an input face for receiving the X rays and an output face through which the X-ray beams exit the integrated X-ray source.

Integrated X-ray source having a multilayer total internal reflection optic device

An X-ray imaging system that produces one or more fan-shaped beams is described. The system includes a target for emitting X rays that includes at least one target focal spot, and one or more graded multilayer optic devices in optical communication with the target. The optics transmits at least a portion of the source X rays to produce the one or more fan-shaped beams. The graded multilayer optic devices include at least a first graded multilayer section for redirecting and transmitting X rays through total internal reflection. The graded multilayer section includes a high-index layer of material having a first complex refractive index n, a low-index layer of material having a second complex refractive index n, and a grading zone disposed between the high-index and low-index layers of material. The grading zone includes a grading layer having a third complex refractive index nsuch that Re(n)&#x3e;Re(n)&#x3e;Re(n).

Fan-shaped X-ray beam imaging systems employing graded multilayer optic devices

A system for producing at least one high flux photon beam is provided. The system includes two or more photon sources configured to produce photon beams, and at least one first stage optic device coupled to at least one of the photon sources and providing at least one focused photon beam through total internal reflection, wherein at least one of the photon beams and the focused photon beams are combined at a virtual focal spot.

High flux photon beams using optic devices

An imaging technique is provided for acquiring scatter free images of an object. The technique includes acquiring a plurality of projection images of the object using a source and a detector oriented at a plurality of projection angles relative to the object, and generating a plurality of scatter free projection images by correcting the plurality of projection images based on respective ones of a plurality of stored scatter images. The scatter images are generated and stored for each of the projection angles by positioning a scatter rejection plate between the object and the detector. The technique further includes reconstructing a three-dimensional image of the object based on the scatter free projection images.

Imaging system and method with scatter correction

A method is provided for processing an image. The method comprises identifying one or more contours or surfaces in a two-dimensional or three-dimensional image generated from a set of projection data. The set of projection data is differentially processed based on the identification of those data points that largely define one or more contours or surfaces. An enhanced image set is reconstructed from the set of processed projection data.

Geometry-dependent filtering in CT method and apparatus

A system and method for ascertaining the identity of an object within an enclosed article. The system includes an acquisition subsystem, a reconstruction subsystem, a computer-aided detection (CAD) subsystem, and an alarm resolution subsystem. The acquisition subsystem communicates view data to the reconstruction subsystem, which reconstructs it into image data and communicates it to the CAD subsystem. The CAD subsystem analyzes the image data to ascertain whether it contains any area of interest. A feedback loop between the reconstruction and CAD subsystems allows for continued, more extensive analysis of the object. Other information, such as risk variables or trace chemical detection information may be communicated to the CAD subsystem to dynamically adjust the computational load of the analysis.

System and method for detecting an object by dynamically adjusting computational load

An integrated, multi-sensor, Level 1 screening device is described, which system provides a next-generation Explosives Detection System (EDS) that enables high throughput, while drastically reducing false alarms. In exemplary embodiments, the present system comprises a non-rotational, Computed Tomography (CT) system and a non-translational, X-ray diffraction (XRD) system, both in an inline configuration.

Integrated multi-sensor systems for and methods of explosives detection

Disclosed herein is a method for detecting high atomic number elements in an article by using radiation having two different energies. The detecting of high atomic number elements can be accomplished by using an algorithm, curve fitting or using a data table. Disclosed herein too is a radiation system that uses the aforementioned method for detecting high atomic number elements.

Method for detecting the presence of high atomic number elements

A multi-energy imaging system and method for selectively generating high-energy X-rays and low-energy X-ray beams are described. A pair of optic devices are used, one optic device being formed to emit high X-ray energies and the other optic device being formed to emit low X-ray energies. A selective filtering mechanism is used to filter the high X-ray energies from the low X-ray energies. The optic devices have at least a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a second photon transmission property. The first and second layers are conformal to each other.

Multi-energy imaging system and method using optic devices

A cargo container inspection radiation detector apparatus is disclosed. The apparatus includes a support, and a plurality of area radiation detectors disposed upon the support arranged corresponding to a height of the cargo container, each area radiation detector comprising an active area defined by a matrix of pixels.

Cargo container inspection system and apparatus

A method, system and apparatus for processing a radiographic image of a scanned object is disclosed. A pixel offset correction is performed in integer format on the radiographic image using saturation arithmetic to produce an image in integer format with any negative corrected values clipped to a value of zero. The resulting pixels are converted to floating point format and the converted pixels are multiplied by a gain factor. Optionally the resulting pixels are recursively averaged with previous results. The resulting pixels are converted to integer format and the converted pixel values are clamped to a maximum value using saturation arithmetic. Non-functional pixel correction is performed in integer format and the resulting pixel values are clamped to a maximum value using saturation arithmetic. An optional processing path replaces the recursive average by a linear average. The resulting pixel values are optionally filtered to enhance features of interest. The resulting pixel value is mapped in integer format to a palette index to establish an output pixel intensity having one of many intensity levels. The optional processing is controlled through the hardware interface of a real-time image controller as images are acquired.

Method, system and apparatus for processing radiographic images of scanned objects

An X-ray imaging system is provided that includes a target for emitting X-rays and having at least one target focal spot, and an array of multilayer optic devices for transmitting X-rays through total internal reflection. The array of multilayer optics devices are in optical communication with the at least one target focal spot. Further, a method for imaging an object with an X-ray imaging machine is provided. Also, a method for forming a stack of multilayer optic devices is provided.

X-ray imaging system and methods of using and forming an array of optic devices therein

A system and method for ascertaining the identity of an object within an enclosed article. The system includes an acquisition subsystem utilizing a stationary radiation source and detector, a reconstruction subsystem, a computer-aided detection (CAD) subsystem, and a 2D/3D visualization subsystem. The detector may be an energy discriminating detector. The acquisition subsystem communicates view data to the reconstruction subsystem, which reconstructs it into image data and communicates it to the CAD subsystem. The CAD subsystem analyzes the image data to ascertain whether it contains any area of interest. Any such area of interest data is sent to the reconstruction subsystem for further reconstruction, using more rigorous algorithms and further analyzed by the CAD subsystem. Other information, such as risk variables or trace chemical detection information may be communicated to the CAD subsystem to be included in its analysis.

System and method for detecting an object

A method of determining a presence of items of interest within a cargo container is disclosed. The method includes obtaining information from an initial radiation scan of at least one of the cargo container and contents therein, identifying a target portion of the cargo container in response to the information obtained, transmitting a target radiation beam along the target portion of the cargo container, and detecting radiation received in response to the transmitting. The method further includes analyzing the detected radiation for a presence of items of interest, and in response to the analyzing, generating a first signal indicative of the presence of the items of interest, or generating a second signal indicative of an absence of the items of interest.

Inspection system and method

An optic device, system and method for making are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a second photon transmission property. The first and second layers are conformal to each other. The optic device may be fabricated by vapor depositing a first layer and then vapor depositing a second layer thereupon. The first layer may be deposited onto a blank or substrate. The blank or substrate may be rotated during deposition. Further, a computer-controlled shutter may be used to alter the deposition rate of material along an axis of the optic device. Alternatively, the optic device may be moved at varying speeds through a vapor stream to alter the deposition rate of material.

Multilayer optic device and system and method for making same

Growing community of inventors

Cohoes, NY, United States of America

Forrest Frank Hopkins