Infineon Technologies Ag

Other

Florian Starzer

Rainer Stuhlberger

Helmut Kollmann

Jochen Oliver Schrattenecker

Oliver Frank

Alexander Melzer

Michael Kropfitsch

Mathias Zinnoecker

Thomas Sailer

Roland Vuketich

Peter Bogner

Herbert Knapp

Hao Li

Herbert Jaeger

Alexander Onic

Mario Huemer

Guenter Haider

Georg Krebelder

Karl Dominizi

Erich Kolmhofer

Jonas Wursthorn

Dietmar Kissinger

Jonas Kammerer

Christoph Hazott

Bruno Mariacher

Otto Pfabigan

Sebastian Pointner

Ralf Reiterer

A radar method is described. According to one exemplary embodiment, the method includes generating a first RF oscillator signal in a first chip and supplying the first RF oscillator signal to a transmission (TX) channel of the first chip and transmitting the first RF oscillator signal from the TX channel of the first chip to the second chip via a transmission line.

Radar front-end with RF oscillator monitoring

A radar system includes a first chip having a first radio frequency (RF) contact; a second chip having a second RF contact; a first RF oscillator integrated in the first chip and has an output coupled to the first RF contact; a second RF oscillator integrated in the second chip; a transmission line connecting the first RF contact to the second RF contact; a demodulator that is arranged in the second chip and has a first RF input; wherein the first RF oscillator is configured to generate a first RF oscillator signal that is transmitted to the first RF input of the demodulator via the first RF contact, the transmission line, and the second RF contact, and wherein a controller is configured to determine a first propagation delay of the first RF oscillator signal arriving at the second chip on a basis of information obtained from the demodulator.

A method for producing a semiconductor device is described. In accordance with one example embodiment, the method comprises providing a virtual DUT in the form of a behavior model of the semiconductor device and developing at least one test in a test development environment for an automatic test equipment (ATE). In this case, commands are generated by means of the test development environment, which commands are converted into test signals by means of a software interface, which test signals are fed to the virtual DUT and are processable by the latter. The software interface processes response signals of the virtual DUT and reports information dependent on the response signals back to the test development environment.

Method for producing a semiconductor device by means of computer-aided development of test scenarios

A radar device comprises a test signal generator including a digital harmonic oscillator that generates a digital oscillator signal with a first spectral component; a first digital-to-analog-converter that generates an analog oscillator signal based on the digital oscillator signal. Furthermore, the radar device comprises at least one radar channel receiving the analog oscillator signal during one or more self-tests.

RF receiver with built-in test capabilities

A method for estimating phase noise of an RF oscillator signal in a frequency-modulated continuous-wave (FMCW) radar system and related radar devices are provided. The method includes applying the RF oscillator signal to an artificial radar target composed of circuitry, which applies a delay and a gain to the RF oscillator signal, to generate an RF radar signal. Furthermore, the method includes down-converting the RF radar signal received from the artificial radar target from an RF frequency band to a base band, digitizing the down-converted RF radar signal to generate a digital radar signal, and calculating a decorrelated phase noise signal from the digital radar signal. A power spectral density of the decorrelated phase noise is then calculated from the decorrelated phase noise signal, and the power spectral density of the decorrelated phase noise is converted into a power spectral density of the phase noise of an RF oscillator signal.

Radar device with phase noise estimation

An RF front-end circuit of an RF transceiver is described herein. In accordance with one exemplary embodiment, the fronted circuit includes a local oscillator (LO) configured to generate an RF transmit signal, an RF output port coupled to the local oscillator, wherein the RF transmit signal is output at the RF output port, and a monitoring circuit receiving an input signal and configured to determine the phase of the input signal or the power of the input signal or both. A directional coupler is coupled to the RF output port and configured to direct a reflected signal incoming at the RF output port as input signal to the monitoring circuit, and a controller is configured to detect, based on the determined phase or power or both, a defect in a signal path operably connected to the RF output port.

RF Transceiver with test capability

One exemplary embodiment of the present invention relates to a circuit that includes at least one RF signal path for an RF signal and at least one power sensor, which is coupled to the RF signal path and configured to generate a sensor signal representing the power of the RF signal during normal operation of the circuit. The circuit further includes a circuit node for receiving an RF test signal during calibration operation of the circuit. The circuit node is coupled to the at least one power sensor, so that the at least one power sensor receives the RF test signal additionally or alternatively to the RF signal and generates the sensor signal as representing the power of the RF test signal.

RF front-end with power sensor calibration

Exemplary embodiments disclosed herein relate to a radar device. The radar device may transmit an RF oscillator signal to a radar channel and receive a respective first RF radar signal from the radar channel. The radar device may further generate a second RF radar signal. Frequency conversion circuits are also disclosed to down-convert the first RF radar signal and the second RF radar signal. An analog-to digital conversion unit may digitize the down-converted first RF radar signal and the down-converted second RF radar signal to generate a first digital signal and a second digital signal, respectively. A digital signal processing unit is disclosed to estimate a phase noise signal included in the second digital signal and to generate a cancellation signal based on the estimated phase noise signal. The cancellation signal is subtracted from the first digital radar signal to obtain a noise compensated digital radar signal.

Radar device with noise cancellation

A radio frequency (RF) transmitter for self-sensing power and phase of an RF signal is provided. A local oscillator (LO) is configured to generate a LO signal. A power amplifier is configured to generate the RF signal from the LO signal, wherein the LO and RF signals are periodic signals sharing a waveform and a frequency. An IQ de-modulator is configured to down convert the LO signal and the RF signal into an in-phase (I) signal and a quadrature (Q) signal, wherein direct current (DC) voltages respectively of the I and Q signals define power and phase of the RF signal. A method for self-sensing power and/or phase of an RF signal, and a radar system within which the RF transmitter is arranged, are also provided.

Phase and amplitude signal sensing circuit for radio frequency (RF) transmitters

RF transceiver with test capability

A radar sensor includes a mixer configured to receive an radio frequency (RF) input signal to down-convert the RF input signal into a base-band or intermediate frequency (IF) band, an analog-to-digital converter (ADC), and a signal processing chain coupled between the mixer and the ADC. The radar sensor further includes an oscillator circuit that is configured to generate a test signal. The ADC is coupled to an output of the signal processing chain, and is configured to generate a digital signal by digitizing an output signal of the signal processing chain, the output signal being derived from the test signal. The radar sensor further includes a digital signal processing circuit coupled to the ADC downstream thereof, the digital signal processing circuit being configured to perform a spectral analysis on frequency values of the digital signal.

RF receiver with built-in self-test function

A radio frequency (RF) receive circuit is described herein. In accordance with one embodiment, the RF receive circuit includes a mixer configured to receive an RF input signal to down-convert the RF input signal into a base-band or intermediate frequency (IF) band, an analog-to-digital converter (ADC), and a signal processing chain coupled between the mixer and the ADC. The signal processing chain includes at least two circuit nodes. The RF receive circuit further includes an oscillator circuit that is configured to generate a test signal. The oscillator circuit is coupled to the signal processing chain and is configured to selectively feed the oscillator signal into one of the at least two circuit nodes.

A radio frequency (RF) transmitter for self-sensing power and phase of an RF signal is provided. A local oscillator (LO) is configured to generate a LO signal. A power amplifier is configured to generate the RF signal from the LO signal, wherein the LO and RF signals are periodic signals sharing a waveform and a frequency. An IQ de-modulator is configured to down convert the LO signal and the RF signal into an in-phase (I) signal and a quadrature (Q) signal, wherein direct current (DC) voltages respectively of the I and Q signals define power and phase of the RF signal. A method for self-sensing power and phase of an RF signal, and a radar system within which the RF transmitter is arranged, are also provided.

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Ennsdorf Bei Enns, Austria

Florian Starzer