Rohde and Schwarz Gmbh & Co. Kg

Rohde & Schwarz Gmbh Co. Kg

Florian Ramian

Andreas Lagler

Alexander Roth

Florian Gerbl

Johannes Steffens

Darren Tipton

Karolin Werthmueller

Gregor Feldhaus

Luke Cirillo

Michael Simon

Wolfgang Wendler

Florian Lang

Wolfgang Dressel

Werner Held

Matthias Ruengeler

Susanne Hirschmann

Christian Kuhn

Martin Breinbauer

Torsten Schorr

Martin Lim

Sebastian Kehl-Waas

Daniel Mueller-Remer

Kay-Uwe Sander

A signal processing circuit for a measurement instrument is described. The signal processing circuit comprises a measurement input, a first measurement channel, a second measurement channel, and a noise canceling circuit. The first measurement channel comprises a first wideband analog-to-digital converter (ADC) and a first transformation circuit. An output signal of the first measurement channel is a first frequency domain signal. An output signal of the second measurement channel is a second frequency domain signal. The first frequency domain signal and the second frequency domain signal are a complex-valued signal, respectively. The noise canceling circuit is configured to receive the first frequency domain signal and the second frequency domain signal and to determine a combined average of the first frequency domain signal and of the second frequency domain signal over a predetermined number of frequency bins, thereby obtaining a complex-valued average signal. Further, a measurement system is described.

Signal processing circuit and measurement system

An apparatus and a method for accurate determination of a transfer function of a device under test (DUT) comprising a measurement unit adapted to measure a transfer function of the device under test (DUT) across a frequency range in response to a wideband signal applied by the measurement unit to the device under test (DUT), a preprocessing unit adapted to cut out data of the measured transfer function at frequencies where the applied wideband signal comprises a low spectral power density and a data processing unit adapted to process the remaining data of the measured transfer function to determine an accurate transfer function of said device under test (DUT).

Method and apparatus for an accurate determination of a transfer function of a device under test

A measurement system for determining a noise figure of a device under test is described. The measurement system determines a first total error power based on the output signal by a first noise canceling technique, wherein the first total error power includes systematic errors originating in the device under test and in the measurement system. The measurement system determines a second total error power based on the output signal by a different, second noise canceling technique. The second total error power includes systematic errors originating in the measurement system. The second total error power further includes noise originating in the device under test and in the measurement system outside of the measurement instrument. The measurement system is configured to subtract the first total error power from the second total error power, thereby obtaining an external noise power.

Measurement system and method of determining a noise figure of a device under test

The present invention relates to a method and an apparatus for generating an output signal with adjustable phase noise. The apparatus comprises waveform generation circuitry configured to generate a reference signal. Further, the apparatus comprises oscillator circuitry configured to generate an adjustable local oscillator (LO) signal. In addition, the apparatus comprises mixer circuitry coupled to the waveform generation circuitry and the oscillator circuitry and configured to mix the reference signal with the LO signal (LO) to generate the output signal having phase noise based on the LO signal. Further, the present invention relates to a system comprising such apparatus.

Apparatus and method for generating an output signal with adjustable phase noise, and system

A detector circuit for a measurement instrument is described. The detector circuit includes a first signal input, a second signal input, and an averaging sub-circuit. The first signal input is configured to receive a first complex-valued measurement signal associated with an input signal received from a device under test. The second signal input is configured to receive a second complex-valued measurement signal associated with the input signal received from the device under test. The averaging sub-circuit is configured to determine an average of the first complex-valued measurement signal and of a complex conjugate of the second complex-valued measurement signal over a predetermined number of samples, thereby obtaining a complex-valued average signal. The averaging sub-circuit is configured to generate an output signal based on the complex-valued average signal. Further, a signal processing circuit and a measurement instrument are described.

Detector circuit, signal processing circuit, and measurement instrument

The present disclosure provides a measurement application device calibration unit, comprising a coupling element comprising a first connection and a second connection for coupling the coupling element into a signal measurement path, and a third connection, wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path, and comprising a signal processing device that is coupled to the third connection of the coupling element and that is configured to receive the predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection, and to generate a predetermined calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path.

Measurement application device calibration unit, measurement system, method

A signal processing method for selectively removing noise from a digital input signal is provided. The method includes the steps of, for example, receiving, by a signal input, a digital input signal of a device under test, determining, by an analysis circuit, a DUT noise contribution to noise of the digital input signal, wherein the DUT noise contribution is associated with noise originating from the device under test, reducing, by the analysis circuit, a noise level of the digital input signal to a noise level of the DUT noise contribution determined, thereby obtaining a noise-reduced output signal, and providing the noise-reduced output signal to a measurement application for further processing. A signal processing system for carrying out the method or others is also provided.

Signal processing method and signal processing system

A radio frequency testing apparatus with voltage standing wave ratio adjustment for testing a device under test is provided. Said radio frequency testing apparatus comprises an input, an output, a signal source for providing a test signal for the device under test via the output, thereby forming an output signal path, a signal sink for receiving a received signal from the device under test via the input, thereby forming an input signal path, and a tracking generator. In this context, the tracking generator and/or the signal sink is configured to determine a corresponding voltage standing wave ratio at the input and/or at the output. Furthermore, the signal source is configured to pre-equalize the test signal on the basis of the corresponding voltage standing wave ratio at the output and/or the input. In addition to this or as an alternative, the signal sink is configured to post-correct the received signal on the basis of the corresponding voltage standing wave ratio at the input and/or the output.

Radio frequency testing apparatus with voltage standing wave ratio adjustment and corresponding method

A method of providing signal level performance information with respect to an electronic component is described. The electronic component includes a signal input. An input signal is received at the signal input or immediately upstream of the signal input. At least one power level parameter is determined, wherein the power level parameter is indicative of a power level of the input signal received. A performance indicator is provided, which includes information on a performance of the electronic component in dependence of the at least one power level parameter. A signal level performance information is determined with respect to the electronic component based on the at least one determined power level parameter and based on the performance indicator. Further, a monitoring system is described.

Method and monitoring system for providing signal level performance information

A signal processing circuit for a measurement instrument is described. The signal processing circuit includes an analysis circuit, a measurement input, and at least two parallel measurement channels. The parallel measurement channels are configured to process the input signal, thereby generating first and second complex-valued measurement signals. The analysis circuit is configured to determine first and second error quantities associated with the first and second complex-valued measurement signals, respectively. The analysis circuit is configured to determine a complex-valued average signal corresponding to a combined average of the first and second complex-valued measurement signals. The analysis circuit is configured to determine a combined error quantity based on the complex-valued average signal. The analysis circuit is configured to determine a comparison quantity based on the combined error quantity as well as based on the first error quantity and/or the second error quantity.

Signal processing circuit and measurement instrument

Embodiments of the present disclosure relate to methods of finding optimized analog measurement hardware settings of a measurement system for a target measurement. The method can include one or more of the following steps: applying initial settings to the measurement system; varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal; performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep; and identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers.

Method of finding optimized analog measurement hardware settings as well as method of measuring a device under test

The present disclosure relates to a method for testing a device under test by using a test system. The method comprises the steps of: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a test and measurement instrument; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

Method as well as test system for testing a device under test

A measurement system for characterizing a device under test is described. The measurement system includes a signal source, an analysis module, and a directional element that is connected to each of the device under test, the signal source, and the analysis module. The signal source is configured to generate a digital instruction signal or an analog stimulus signal for the device under test. In the case of generating the analog stimulus signal, the directional element is configured to forward the analog stimulus signal from the signal source to the device under test, wherein the device under test includes circuitry configured to generate a digital output signal based on the analog stimulus signal received. In the case of generating the digital instruction signal by the signal source, the device under test includes circuitry configured to generate an analog output signal based on the digital instruction signal received, wherein the directional element is configured to forward the analog output signal generated to the analysis module. The analysis module includes circuitry configured to determine at least one characteristic parameter of the device under test based on the analog output signal of the device under test or the digital output signal of the device under test. Moreover, a measurement method for characterizing a device under test is described.

Measurement system and measurement method

A phase noise measurement method of measuring phase noise of a device under test is described. The phase noise measurement method includes the steps of: determining, by a measurement circuit, measurement IQ data based on an output signal of a device under test; setting, by a control circuit, a magnitude threshold; determining, by an analysis circuit, critical samples of reference IQ data for which a magnitude of a reference signal is smaller than the magnitude threshold; discarding the critical samples of the reference IQ data and corresponding critical samples of the measurement IQ data, thereby obtaining modified reference IQ data and modified measurement IQ data; and determining, by the analysis circuit, a phase noise spectrum of the output signal of the device under test based on the modified reference IQ data and based on the modified measurement IQ data. Further, a measurement system is described.

Phase noise measurement method and measurement system

A method of customized setting at least one measurement device, comprises the steps of setting an intended measurement setup on the at least one measurement device manually via a user interface, recording, via a command recorder, at least one remote control command assigned to the manual setting of the intended measurement setup, converting the at least one remote control command recorded into specific instructions, and generating a standalone executable code at least based on the specific instructions obtained from the remote control command recorded. Further, a measurement system is provided.

Growing community of inventors

Munich, Germany

Florian Ramian