Leica Microsystems Cms Gmbh

Carl Zeiss Microscopy Gmbh

Max-Planck-Gesellschaft Zur F&#xf6;rderung Der Wissenschaften E. V.

Florian Fahrbach

Werner Knebel

Helmut Lippert

Frank Sieckmann

Jörg Siebenmorgen

Jan Huisken

Ralf Wolleschensky

Christian Schumann

Joachim Bradl

Lars Friedrich

Constantin Kappel

Wernher Fouquet

Sebastian Tille

Oliver Schlicker

Peter Pott

Alexander Rohrbach

Ulf Schwarz

An optical device for a microscope includes a reflector assembly including a beam entrance, at which a light beam can be coupled into the reflector assembly, including a beam exit, and including a beam path extending within the reflector assembly. The beam path begins in the reflector assembly at the beam entrance and passes the beam exit multiple times. On each passage of the beam path, partial beams are coupled out of the reflector assembly at the beam exit. The partial beams coupled out at the beam exit either extend in parallel and so as to be spaced apart from one another or are directed out of the reflector assembly starting from a common starting point.

Optical device, retrofitting set and method for producing light sheets by means of a reflector

An optical arrangement for an inclined-plane microscope, includes: an optical illumination and detection arrangement, an optical erecting unit for imaging the real intermediate image on a detector, wherein an optical axis of the erecting unit is inclined with respect to an optical axis of the optical illumination and detection arrangement and is oriented substantially perpendicularly to the real intermediate image plane, and an attachment element arranged on the erecting unit, extending in a direction of the real intermediate image, and forming an interface which is oriented substantially parallel to the real intermediate image plane, wherein beam paths of the illumination light and of the scattered and/or fluorescent light transmitted by the illumination and detection arrangement are coupled in and intersect on the image side of the illumination and detection arrangement, and wherein the beam path of the illumination light is spaced apart from the interface.

Optical assembly for an inclined-plane microscope for improving the resolution

A microscope includes a wide-field illuminator configured to illuminate at least one selected region of a sample, and a beam splitter configured to generate a first detection beam path and a second detection beam path. A camera detector is arranged within the first detection beam path and is configured to record images of the selected region of the sample. A point detector is arranged within the second detection beam path and is configured to acquire a predetermined subregion of the sample lying within the selected region. A detection objective, which is arranged within the first and second detection beam paths on an object side of the beam splitter. The detection objective is a common detection objective for the camera detector and the point detector.

Microscope with a wide-field illuminator and a common detection objective for a camera detector and a point detector

An optical system includes an illumination device, an erecting optical unit and a scanning device. The illumination device is configured to generate illumination light. The scanning device is configured to generate a temporal sequence of at least two tilted illumination planes for illuminating a stationary sample volume. The at least two tilted illumination planes are arranged at a distance from one another and parallel to one another.

Optical system with a tilted illumination plane and method for illuminating a sample volume in an optical system with a tilted illumination plane

A method for high-resolution imaging includes illuminating a target region of a specimen by first and second illumination light beams during respective holding durations to transfer respective subsets of fluorophores from a first into a second state. The fluorophores emit fluorescence photons upon transition from the second back into the first state, which are used to produce respective raw images. The illumination light beams have different power and/or beam profiles. A high-resolution image is produced from the raw images. The respective holding durations are shorter than a lifetime of a third state of the fluorophores, into which a third subset of the fluorophores is transferred by the illumination of the target region by the first and/or second illumination light beam, and the lifetime of the third state is longer by a factor of at least 2 than a lifetime of the second state.

Method and microscope for the high-resolution imaging of a specimen by light microscopy

A illumination arrangement for a microscope for illuminating a sample with a light sheet includes an illumination input configured to feed an illumination beam along an optical axis of the illumination arrangement and an illumination output which faces a sample side and is configured to output the illumination beam to the sample side. A focusing optical system is provided with a set depth of focus. At least one optical modification element is configured to geometrically modify the illumination beam. Different rays of the illumination beam intersect the optical axis within an axis intersection region at the illumination output. The axis intersection region extends over at least the depth of focus of the focusing optical system along the optical axis.

Illumination arrangement for a microscope, microscope and method for illuminating a sample volume in a microscope

An optical device for illuminating a sample located in a sample volume with illumination light and for detecting scattered and/or fluorescent light from the sample includes an optical illumination assembly, an optical detection assembly and at least one attachment element. The optical illumination assembly is configured to transmit the illumination light along an illumination path into the sample volume. The optical detection assembly is configured to collect and relay the scattered and/or fluorescent light from the sample volume along a detection path. At least portions of the illumination path and/or of the detection path extend in the at least one attachment element.

Optical device, optical module and microscope for scanning large samples

A method for determining a neural network for correcting optical aberrations includes determining one or more images that are at least partly related to an optical system or the design of an optical system. A neural network is determined on the basis of the determined one or more images in such a way that the determined neural network when applied to an image captured by the optical system outputs an image which has been corrected in relation to one or more optical aberrations.

Optical correction via machine learning

A method for manipulating at least one beam path in a microscope includes ascertaining a refractive index of a sample arranged in a sample volume and/or of an optical medium arranged in the sample volume. At least one microscope parameter is set in dependence on the ascertained refractive index for manipulating the beam path.

Method and device for manipulating a beam path in a microscope, method for recording image stacks in a microscope

In a method for the examination of a sample the sample is illuminated in a sample plane along a sample line with an illuminating light beam. The sample is acted upon by a depletion or switching light beam, which overlaps in the sample plane in an overlap region at least partially spatially with the illuminating light beam and which has at least one wavelength suitable for depletion of the sample. Part of fluorescent light emanating from the sample plane is detected as detection light. The fluorescent light originating from outside a first subregion and a second subregion is at least partially suppressed and not detected.

Method for examining a sample, and device for carrying out such a method

A light sheet fluorescence microscope includes a light source configured to emit excitation light suitable for inducing fluorescent light emitted from a specimen, a detector configured to detect the fluorescent light from the specimen, and an optical system configured to illuminate the specimen with a light sheet formed from the excitation light, and to guide the fluorescent light from the illuminated specimen to the detector. The optical system includes an objective facing the specimen, the objective being configured to collect the fluorescent light emitted from the specimen. The light source is further configured to emit manipulation light suitable for photomanipulating the specimen. The optical system is further configured to direct the manipulation light through a spatially limited sub-area of an entrance pupil of the objective onto the specimen along a light propagation direction which is different from a light propagation direction of the light sheet.

Light sheet fluorescence microscope

A light microscope includes a scan illumination unit, which is designed to illuminate a specimen having a line focus produced by an illumination light beam and moved transversely to a light propagation direction. A descanned detection unit is designed to produce a stationary first line image of a target region from detection light that originates from a target region of the specimen illuminated with the moving line focus. The scan illumination unit and the descanned detection unit have a common objective, which is designed to receive both the illumination light beam and the detection light. The descanned detection unit contains a dispersive element, which is designed to spectrally split the detection light in order to generate multiple second line images, corresponding to the first line image, with different spectral compositions.

Light microscope

A light sheet microscope, such as an oblique plane microscope or a swept confocally-aligned planar excitation (SCAPE) microscope, includes an optical system with a first optical element, a second optical element and a mirror assembly. In a first operational state of the microscope, the optical system is configured to transmit illumination light along a first illumination light path through the first optical element into a first sample volume, and configured to transmit observation light along a first observation light path from the first sample volume to a detector device. In a second operational state of the microscope, the optical system is configured to transmit the illumination light along a second illumination light path via the mirror assembly through the second optical element into a second sample volume, and configured to transmit observation light along a second observation light path from the second sample volume to the detector device.

Light sheet microscope with exchangeable optical elements

A light sheet microscope includes an object slide, and optical illumination and detection systems. The optical illumination system includes an illumination objective configured to illuminate a first object plane that is oblique relative to a slide plane with a light sheet. The optical detection system includes a detection objective and an image sensor device. The image sensor device is configured to define a first image plane which is orthogonal to an optical axis of the detection objective and to define a second image plane which is tilted relative to the first image plane. The detection objective is configured to image a focal plane onto the first image plane and to image a second object plane of the object onto the second image plane, the focal plane being coincident with the first object plane, and the second object plane being parallel to or coincident with the slide plane.

Light sheet microscope and method for imaging an object

A method for adjusting a focus of an optical system includes focusing measurement light in a sample space using an optical arrangement. The measurement light is transmitted on a sample side of the optical arrangement through at least one optical medium. The measurement light reflected by a reflector and transmitted through a further optical arrangement is detected using a detector arrangement. A working distance between the optical arrangement and the reflector is ascertained based on the measurement light detected by the detector, wherein a focus of the measurement light lies on the reflector for the working distance.

Method and device for adjusting the focus or determining the refractive index of a sample medium, non-volatile computer-readable storage medium and microscope

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Mannheim, Germany

Florian Fahrbach