Ati Technologies Ulc

Filipp Chekmazov

Grigori Temkine

Oleg Drapkin

Paul Edelshteyn

Kristina Au

A system and method for measuring integrated circuit (IC) temperature. An integrated circuit (IC) includes a thermal sensor and data processing circuitry. The thermal sensor utilizes switched currents provided to a reference diode and a thermal diode. The ratios of the currents provided to each of these diodes may be chosen to provide a given delta value between the resulting sampled diode voltages. At a later time, a different ratio of currents may be provided to each of these diodes to provide a second given delta value between the resulting sampled diode voltages. A differential amplifier within the data processing circuitry may receive the analog sampled voltages and determine the delta values. Other components within the data processing circuitry may at least digitize and store one or both of the delta values. A difference between the digitized delta values may calculated and used to determine an IC temperature digitized code.

Dynamic voltage reference for sampling delta based temperature sensor

A reference voltage generator is provided. In an example, the reference voltage generator includes a temperature-dependent device, a processing module configured to process a digital representations of first and second voltages derived from the temperature-dependent device and a reference voltage to determine a value, and a digital to analog converter (DAC) configured to generate a reference voltage based on the value. The first voltage is proportional to absolute temperature (PTAT) and the second voltage is complementary to absolute temperature (CTAT) and the reference voltage is substantially independent of absolute temperature in an operating temperature range of the reference voltage generator.

Self-calibrating digital bandgap voltage and current reference

A method and circuitry for determining a temperature-independent bandgap reference voltage are disclosed. The method includes determining a quantity proportional to an internal series resistance of a p-n junction diode and determining the temperature-independent bandgap reference voltage using the quantity proportional to an internal series resistance.

Auto-calibrating a voltage reference

A method includes generating a first, second and third voltage output from a temperature sensing element of an integrated circuit using a respective, corresponding first, second and third, switched current source, for sequentially switching a respective first, second and third excitation current through the temperature sensing element. The third switched current source generates the corresponding third voltage output as a reference voltage between the first voltage and the second voltage. An error corrected difference is calculated between the first voltage and the second voltage using the reference voltage. In the method, the second excitation current is proportional to the first excitation current by a value n, and the third excitation current is proportional to the first excitation current by the square root of n.

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Toronto, Canada

Filipp Chekmazov