Intel Corporation

Fernando A Lopez

Vincent J Zimmer

Michael A Rothman

Mallik Bulusu

Rahul Khanna

Robert Charles Swanson

Kai Cheng

Robin A Steinbrecher

Christian Le

In some embodiments, a memory control device includes a sensor positioned remotely from a memory device, a register to store an offset value, the offset value corresponding to a difference between a temperature reading of the sensor and an estimated actual temperature of the memory device, and a controller to control an operation of the memory device, wherein the controller is configured to read the offset value from the register and control the operation of the memory device in accordance with the offset value. The controller may be configured to dynamically update the offset value during an operation of the memory device. Other embodiments are disclosed and claimed.

Dynamic updating of thresholds in accordance with operating conditons

Methods and apparatus dynamically reconfigure storage or channel capacities in a memory system. A fully-buffered dual in-line memory module (DIMM) is configured for a particular storage capacity and a particular channel capacity. An error may be detected at a memory address in some portion of the DIMM. To resolve the problem, the storage capacity or the channel capacity may be reduced and the DIMM may be dynamically reconfigured according to the reduced capacity. For one embodiment the DIMM may be reconfigured by mapping the portion of the DIMM containing the error as unavailable and taking that portion off-line without taking the entire DIMM off-line. For another embodiment the DIMM may be reconfigured by throttling the DIMM at a reduced frequency. The portion of the DIMM containing the error may be retested at the reduced frequency. If no errors are detected, the DIMM may be made available at the reduced frequency.

Method and apparatus for improved memory reliability, availability and serviceability

Growing community of inventors

Hillsboro, OR, United States of America

Fernando A Lopez