Analog Devices,inc.

Analog Devices Global

Fergus John Downey

Roderick McLachlan

Patrick Martin McGuinness

Bernard Patrick Stenson

Avinash Gutta

Neville Craig

Patrick Elebert

James Michael Molyneaux

A digital-to-analog converter (DAC) comprising a first section having a first plurality of current flow paths forming binary weighted values in the DAC; and a second section connected to the first section and having a second plurality of current flow paths, wherein each of the first and second plurality of current flow paths are switchable between first and second nodes, and wherein weights of one or more of the second plurality of current flow paths are notionally equal to weights of one or more of the first plurality of current flow paths so as to provide redundancy in the first section.

Digital-to-analog converter and a method of operating a digital-to-analog converter

A method for altering a resistance of a resistor including trimming the resistor using a first type of trim approach to increase a resistance measurement of the resistor to above a target resistance value, and iteratively trimming the resistor using a second type of trim approach until a power coefficient of resistance (PCR) or temperature coefficient of resistance (TCR) measurement of the resistor is substantially close to zero.

Method for altering electrical and thermal properties of resistive materials

A digital-to-analog converter (DAC) includes a resistor leg that is switchably connected to a first voltage reference via an n-channel MOSFET and to a second voltage reference via a p-channel MOSFET, and a generator circuit. The generator circuit further includes a first sub-circuit for generating a drive voltage (Vgn) and a second sub-circuit for a) offsetting the first drive voltage by an offset voltage to generate a second drive voltage, and b) supplying the second drive voltage to a gate of one of the first NMOS and the first PMOS.

Digital-to-analog converter with controlled gate voltages

Apparatus and methods of trimming resistors are disclosed. In one embodiment, a method of controlling the PCR of a thin film resistor is provided. The method includes applying a first current to a resistor so as to alter a property of the resistor, and measuring the property of the resistor. Applying the first current and measuring the property of the resistor can be repeated until the PCR of the resistor is within an acceptable tolerance of a desired value for the property of the resistor.

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Edinburgh, United Kingdom

Fergus John Downey