General Electric Company

Ferenc Fazekas

Peter Nagy

Geza Zoltan Cseh

Bela Mezei

István Magai

Laszlo Balla

A lamp includes a light transmissive envelope comprising two spaced apart elliptical portions that together form a hollow interior. The envelope has sealed end portions. Leads are in electrical contact with the filament near the end portions of the envelope for providing power to the lamp. There is a central portion of the envelope that spaces apart the elliptical portions. An electrically conductive filament is disposed in the interior of the envelope. The filament includes coiled-coil portions disposed in the elliptical portions in a coiled-coil shape and a single coil interval portion disposed between the coiled-coil portions at the central portion of the envelope. At least one filament support positions the filament near a center of the envelope. Gas is contained in the interior of the envelope.

Efficient lamp with envelope having elliptical portions

A technique for mounting single or double ended quartz halogen or HID burner on threaded incandescent lamp base facilitating high volume production and use of existing manufacturing equipment. The pinched end portion of the burner is received in a slot formed in an end of a ceramic tubelet and secured therein and supported thereon by cementing or elastic adhesive bond material. The tubelet has its opposite end secured over a reduced diameter portion of a stem extending from the incandescent lamp base. An outer bulb of translucent or transparent material is received over the base-burner sub-assembly and the bulb secured to the base.

Illuminating lamp and method of making same

In a method for qualifying an electric circuit having at least one contact, a reference function of thermoelectric voltage versus time of a faultless electric circuit is provided. The circuit is heated by at least one measuring electric impulse. Thermoelectric-voltage-versus-time data of the electric circuit is acquired. The circuit is qualified based on the differences between the acquired data and the reference function. Additionally, in a method for localizing a weak or bad contact of an electric circuit, the circuit is heated by at least one measuring electric impulse, and thermoelectric-voltage-versus-time data of the circuit is acquired. The acquired data is then compared to reference functions of thermoelectric voltage versus time data of known circuits with weak or bad contacts. The weak or bad contact of the circuit is localized in accordance with the similarities between the acquired data and the reference functions.

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Budapest, Hungary

Ferenc Fazekas