Micron Technology Incorporated

Ferdinando D'Alessandro

Erminio Di Martino

Claudio Giaccio

Ferdinando Pascale

Raffaele Mastrangelo

Cristiano Castellano

Andrea Castaldo

Apparatus and methods are disclosed, including test systems for memory devices. Example test systems and methods include power loss logic to determine when one or more test conditions have been met in a memory operation between a host device and a memory device under test. Example test systems and methods include a function to then instruct a power management device to trigger a power loss event.

Power loss test engine device and method

Devices and techniques are disclosed herein for determining, using a host device, a timing relationship between a data strobe signal, such as from an embedded MultiMediaCard (eMMC) device, and an internal clock signal. The host device can control a delay circuit using the determined timing relationship, such as to align received read data for sampling, or to determine or adjust a delay value of the delay circuit.

Data strobe calibration

Data strobe multiplexer

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Nola, Italy

Ferdinando D'Alessandro