Intel Corporation

Feng W Yuan

Junkai Wu

Yong Wu

Mohammad R Haghighat

Juan Zhao

Wei Zong

Zhong Cao

Hongzhen Liu

Method, systems and apparatuses may provide for technology that identifies first data and second data to be stored in a data storage. Each of the first data and the second data are in a first data format. Some technology may also interleave the first data with the second data. The interleaved first and second data are in a second data format. The second data format is different from the first data format.

Interleaved data conversion to change data formats

An apparatus and method for efficient image optimized image stitching. For example, one embodiment of an apparatus comprises: feature search area identification circuitry/logic to narrow down a feature search area based on possible overlap between two image frames; feature detection circuitry/logic to identify a plurality of feature points in a first image frame of the two image frames; feature matching circuitry/logic to map one or more of the plurality of feature points from the first image frame to corresponding feature points in the right image frame; image frame stitching and blending circuitry/logic to stitch the first image frame and second image frame based on the mapping of the feature points between the two image frames and to blend a portion of the first image frame with a portion of the second image frame.

Apparatus and method for optimized image stitching based on optical flow

A tone-mapping technique based on bidirectional logarithm stretch enhances the luminance contrast of not only the dark areas but also the bright areas. In other words, the algorithm not only maps the dark pixels brighter but also map the bright pixels darker.

Tone-mapping high dynamic range images

Growing community of inventors

Shanghai, China

Feng W Yuan