Cadence Design Systems, Inc.

Feng Ling

Enis Aykut Dengi

Ben Song

Warren Harris

Vladimir I Okhmatovski

A method of modeling an integrated circuit includes: specifying a layout for the integrated circuit, wherein the layout includes a plurality of devices arranged in a plurality of layers and a plurality of connections between the layers; specifying locations for a source point and an observation point for the integrated circuit; determining a plurality of static images for the source point and the observation point; determining a plurality of discrete complex images for the source point and the observation point; determining a Green's-function value for the source point and the observation point by combining the static images and the discrete complex images; and saving at least some values based on the Green's-function value.

Evaluating Green's functions for modeling multilayer integrated circuits

A system and method for modeling an IC (integrated circuit) employs a mesh model and a grid model for separating impedance effects between nearby and far-away pairs of mesh elements. Models for relating currents and voltages can be incrementally adapted from other designs or design elements in applications including mixed-signal, analog and RF (radio frequency) circuits.

Library-based solver for modeling an integrated circuit

Incremental solver for modeling an integrated circuit

To estimate a distribution of voltages or currents in the layers of a multi-layer circuit, an exemplary current flow in each layer is discretized into a number of current vector elements and at least one scalar charge element related to the charge associated with each current vector element. A first distribution of voltages induced in each circuit layer is determined from current vector elements in all of the circuit layers. A second distribution of voltages induced in each circuit layer is determined from the scalar charge elements in all of the circuit layers. For each circuit layer, the first and second distributions of voltages induced therein are combined to determine an actual distribution of voltages in the circuit layer.

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Feng Ling