Vanguard International Semiconductor Corporation

Feng-Chih Kuo

Po-Yuan Tang

Wei-Ting Chen

Jian-Yuan Hsiao

A test circuit testing a storage circuit and including a controller, a pattern-generator circuit, a comparing circuit, and a first register is provided. The storage circuit includes a storage block. The controller is configured to generate a plurality of internal test signals. The pattern-generator circuit generates and provides test data to the storage circuit according to the internal test signal. The storage circuit writes the test data into the storage block and reads the storage block to generate read data. The comparing circuit compares the test data and the read data to generate a test result. The first register stores the test result. The controller determines whether the storage circuit is working normally according to the test result stored in the first register.

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Taichung, Taiwan

Feng-Chih Kuo